Patents Assigned to Bruker Ax Microanalysis GmbH
  • Patent number: 7858946
    Abstract: The present invention is directed to an energy dispersive X-ray detector appliance and a method for pulsed reset of said appliance. The present invention provides a ramp-and-neutralize cycled I-FET SDD in which the voltage dependency and nonlinearity due to the integrated FET is reduced via a compensation circuit to a level that can be handled by a correction circuit. The correction circuit does not substantially add noise or other kinds of erroneous signals. Accordingly, the appliance comprises a silicon drift detector with internal field effect transistor I-FET SDD, a compensation circuit for compensating nonlinearities in the I-FET SDD; and a neutralizing circuit adapted to neutralize accumulated charges in I-FET SDD comprising means for pulsed reset of the detector.
    Type: Grant
    Filed: January 17, 2008
    Date of Patent: December 28, 2010
    Assignee: Bruker Ax Microanalysis GmbH
    Inventor: Martin Rohde
  • Publication number: 20080217543
    Abstract: The present invention is directed to an energy dispersive X-ray detector appliance and a method for pulsed reset of said appliance. The present invention provides a ramp-and-neutralize cycled I-FET SDD in which the voltage dependency and nonlinearity due to the integrated FET is reduced via a compensation circuit to a level that can be handled by a correction circuit. The correction circuit does not substantially add noise or other kinds of erroneous signals. Accordingly, the appliance comprises a silicon drift detector with internal field effect transistor I-FET SDD, a compensation circuit for compensating nonlinearities in the I-FET SDD; and a neutralizing circuit adapted to neutralize accumulated charges in I-FET SDD comprising means for pulsed reset of the detector.
    Type: Application
    Filed: January 17, 2008
    Publication date: September 11, 2008
    Applicant: BRUKER AX MICROANALYSIS GMBH
    Inventor: Martin Rohde