Abstract: An X-ray analysis device (1) having an X-ray source (2) for illuminating a sample (6) with X-radiation (4), a sample support for receiving the sample (6) and a detector (12,14) for detecting the diffracted or scattered X-radiation or fluorescent X-radiation (4′) emitted by the sample, wherein an X-ray optical construction element of semi-conductor material having a plurality of channels which are essentially transparent to X-radiation (4,4′) is provided in the path of rays between the X-ray source (2) and the detector (12,14), is characterized in that the X-ray optical construction element comprises a semi-conductor wafer (20;30a;30b;40;50) into which micropores (21;31;41) are etched which extend essentially in parallel in the direction of the rays and have diameters of 0.1 to 100 &mgr;m, preferably 0.5 and 20 &mgr;m.

Abstract: An X-ray fluorescence spectrometer (1) for the analysis of a solid or liquid sample (4) arranged in a measuring position on a sample holder (3) in a compact sample chamber (2), the sample having a maximum linear extension of 1 dm, with an X-ray tube (6) projecting into the sample chamber for irradiating the sample and with a detector (13) being arranged in a detector chamber (9), wherein the detector chamber can be separated in a vacuum-tight manner from the sample chamber by means of a closing element (8), is characterized in that the sample chamber comprises a moveable wall element (5) which, in an “open” state, permits direct access to the sample (4) in its measuring position in the sample chamber (2) and, in a “closed” state, seals the sample chamber (2) with respect to the surrounding atmosphere.

Abstract: An X-ray analysis apparatus having a curved paraboloid-shaped curved graded multilayer Bragg reflector (5) is characterized in that the layers of the reflector (5) are directly introduced onto a concave curved surface of a paraboloid-shaped hollow substrate and a maximum allowable shape deviation for the concave substrate surface facing the reflector is &Dgr;p={square root over (2px)} &Dgr;&thgr;R, and having a maximum allowable waviness Δ ⁢   ⁢ y Δ ⁢   ⁢ x = 1 2 ⁢ Δθ R and a maximum allowable roughness &Dgr;y=d/2&pgr;, preferentially &Dgr;y≦0.

Abstract: A spectrometer for the simultaneous measurement of several spectral lines from a sample (2) with several wavelength selectors (5a, 6a, 7; 5b, 6b, 7) which supply light of a certain wavelength selectively to a detector (9), wherein each wavelength selector selects a different wavelength, is characterized in that at least two different wavelength selectors (5a, 6a, 7; 5b, 6b, 7) can supply light from the sample (2) to the same detector (9) and that the detector (9) is energy-dispersive and has sufficiently large resolution in order to energy separate the detected light of the various wavelengths from the at least two different wavelength selectors.

Abstract: A sample changer (2) for the automatic intake of a multitude of samples into the measurement position on the goniometer axis (a) of an X-ray diffractometer (20) in which the individual samples--each showing a surface, which meets the goniometer axis at a tangent in the measurement position--are linearly arranged on an insertable magazine (3). The samples on the magazine (3) can be moved in the direction of the goniometer axis (a) in order to transport each sample translationally into the measurement position. Furthermore the sample changer (2), the magazine (3) and the mountings (10) show recesses, which allow the refracted X-ray beams from the sample in transmission mode to pass through to the detector (14) unimpeded. The sample changer is suitable for reflection mode as well as transmission mode measurements without having to redesign the system.