Abstract: An X-ray diffractometer (1) comprising an X-ray source (2) emitting a line focus X-ray beam (3; 11) wherein the larger extension of the beam cross section defines a line direction (4; 12) of the X-ray beam (3; 11), further comprising a sample (6; 13), and an X-ray detector (7) rotatable in a scattering plane around an axis ? intersecting the position of the sample (7) is characterized in that the X-ray source is mounted to a switching device (10), which allows to move the X-ray source into one of two fixed positions with respect to the scattering plane, wherein in the first position the line direction (4) of the X-ray beam (3) is parallel to the scattering plane and in the second position the line direction (12) of the X-ray beam (11) is perpendicular to the scattering plane, and wherein the path of the X-ray beam (3, 11) in the two fixed positions of the X-ray source is the same.

Abstract: An X-ray or neutron-optical analysis device comprising means for directing radiation from a source (1) onto a sample (2), and a detector (7) with n substantially identical detector elements (Di) which are disposed parallel, next to each other in a first direction x and which extend in strips in a second direction y, wherein i=1, . . .

Abstract: An X-ray optical system comprising an X-ray source (1), from which X-ray radiation (2) is guided to a sample (4) under investigation, and an X-ray detector (7) for receiving radiation (5) diffracted or scattered from the sample (4), wherein a beam-guiding X-ray optical element (3, 6), such as e.g. a collimator, a mono- or polycapillary, an X-ray mirror or a monochromator, is disposed between the source (1) and the sample (4) and/or between the sample (4) and the detector (7), is characterized in that a wobble means is provided for moving the X-ray optical element (3, 6) in an oscillating fashion during the measurement. The inventive X-ray optical system obtains averaged X-ray analysis information from objects under investigation having large mass which consist of macrocrystalline material without destroying or accelerating the object under investigation.

Abstract: A method for operating an X-ray analysis device with a source (17) for X-ray radiation, an object (19) under investigation which is irradiated with X-ray radiation, and a planar two-dimensional array detector with pixel elements (7) for spatially resolved detection of the X-ray radiation emitted by the object (19), whereby a data set, in particular, in the form of a digitized diffractogram and/or spectrum is obtained, characterized by the following steps: a) recording a first data set (11) in a first relative spatial position (P1) of source (17), object (19) and detector; b) displacement and/or rotation of the detector in the detector plane relative to the source (17) and the object (19), whereby the relative position of source (17) and object (19) is not changed; c) recording a second data set (11) in the position (P2) displaced according to step b); and d) superposition of the recorded data sets (11) to form an overall data set (13), wherein the pixels of the recorded data sets are combined corresponding to

Abstract: An X-ray optical system with two X-ray mirrors (A,B) for imaging an X-ray source (S) on a target region is characterized in that the X-ray mirrors (A,B) are mutually tilted by an angle other than 90° such that the combined region of acceptance of the X-ray mirror (A,B) is adjusted to the shape of the X-ray source (S) and/or the target region. This increases the intensity of the focused X-ray radiation on the sample for a given emission of the X-ray source (S) power using a few, technically simple modifications.

Abstract: An X-ray optical system with an X-ray source (Q) and a first graded multi-layer mirror (A), wherein the extension Qx of the X-ray source (Q) in an x direction perpendicular to the connecting line in the z direction between the X-ray source (Q) and the first graded multi-layer mirror (A) is larger than the region of acceptance (F) of the mirror (A) at a focus (Oa) of the mirror (A) in the x direction, is characterized in that a first collimator (bl) is disposed at a focus of the first graded multi-layer mirror (A) between the X-ray source (Q) and the mirror (A) whose opening in the x direction corresponds to the region of acceptance of the first graded multi-layer mirror (A) and the separation qzA between first collimator (bl) and X-ray source (Q) is: qzA=Qx/tan ?x, wherein ?x is the angle subtended by the first graded multi-layer mirror (A) in the x direction, as viewed from the first collimator (bl).

Abstract: An X-ray analysis system controls the humidity of a sample. The analysis system has a device for dividing a gas flow stream into two portions and for submerging a membrane humidifier tube, containing one of the gas flows, in a water bath in which the gas passing through that tube is moisturized to a desired degree. The two gas flows are subsequently reunited at a controlled temperature to provide for combined moisturized gas at a desired temperature and humidity. The gas is then sprayed onto the sample and an excess moisturized gas vented from the chamber to maintain a moisturize gas sample without condensation of water on or near the sample. This system and a method for its use allow measurements of samples to be made as a function of humidity and temperature over wide ranges of these parameters under highly stable conditions in a straightforward manner which are not susceptible to malfunction and which can be produced and operated at low cost.

Abstract: A detector arrangement for detecting X-ray or neutron radiation redirected from a sample makes use of a one-dimensional particle or photon counting detector. The detector is oriented along a direction that is disposed substantially perpendicularly to a straight line extending between the sample and the detector. The detector may be rotated within the detection plane to allow inexpensive acquisition of two-dimensional diffraction patterns without the use of a two-dimensional detector.

Abstract: A method of determining parameters of a sample by X-ray scattering comprising the steps of exposing the sample to X-rays and measuring scattered X-ray intensity, generating a parameterized model of the sample which is used for numerical simulation of scattered X-ray intensity on the basis of a physical scattering theory, comparing the experimental and simulated X-ray scattering data to generate an error value and modifying the parameters of the model by means of a genetic algorithm involving an amount of individuals each with an equal number N of encoded parameters forming a generation and applying the genetic operators of “selection”, “crossover” and “mutation” used for composing successive generations of evolving individuals, is characterized in that after a given number k of successive generations the genetic operator of “mutation” is no longer applied in evolution of further generations.

Abstract: An analytical method for determining crystallographic phases of a measuring sample comprises the steps of acquiring a diffraction pattern of the measuring sample and qualitative phase analysis of the measured diffraction pattern, acquiring an element spectrum of the measuring sample and determining concentrations of chemical elements in the measuring sample from the acquired element spectrum, and carrying out a quantitative phase analysis of the measuring sample on the basis of the measured intensities of the acquired diffraction pattern thereby taking into consideration determined element concentrations as a boundary condition, wherein differences between calculated and measured intensities of the diffraction pattern and between calculated and determined element concentrations are simultaneously minimized in an iterative process. The inventive method permits quantitative phase determination with high reliability.

Abstract: A method of determining parameters of a sample by X-ray scattering comprising the steps of exposing the sample to X-rays and measuring scattered X-ray intensity, generating a parameterized model of the sample which is used for numerical simulation of scattered X-ray intensity on the basis of a physical scattering theory, comparing the experimental and simulated X-ray scattering data to generate an error value, and modifying the parameters of the model by means of a genetic algorithm involving an amount of individuals each with an equal number N of encoded parameters forming a generation and applying the genetic operators of “selection”, “crossover” and “mutation” used for composing successive generations of evolving individuals, is characterized in that from one generation to the next a “movement” genetic operator is applied which moves at least some of the encoded parameters of at least some of the individuals towards the respective encoded parameters of the individual with the smallest error value.

Abstract: An X-ray analysis apparatus for investigating material samples, comprising a device for automatic exchange of the samples (1), which comprises a sample table (2) with depositing positions (3) disposed in m lines, wherein the lines extend parallel to an x direction and m≧2, and comprising a gripping device (4) for precise removal of any desired sample (1) from a depositing position (3) and for transfer into a transfer and/or measuring position (5) and back to a depositing position (3), wherein the gripping device (4) can be displaced linearly parallel to the x direction, is characterized in that the sample table (2) can be moved linearly parallel to a y direction, extending at an angle &agr; to the x direction, and independently of the gripping device (4) for gripping samples (1) from different lines, wherein the sample table (2) is disposed parallel to the x-y plane.

Abstract: An X-ray analysis apparatus for investigating material samples, comprising a device for automatic exchange of the samples (1), which comprises a gripping device (4) for precise removal of any desired sample (1) from a depositing position (3) and for transfer into a transfer and/or measuring position and back to a depositing position (3), wherein at least some of the samples are surrounded by a sample holder (13;13′) in the peripheral direction, is characterized in that the samples or containers containing the samples project past the sample holder in the vertical z direction perpendicular to the horizontal x-y plane and that the gripping device is disposed and structured on a side of the sample to surround parts of a sample or of a sample container which project past the sample holder in an operating position in the z direction and to grasp the sample holder.

Abstract: An X-ray diffractometer (1) comprising an X-ray source (2) emitting a line focus X-ray beam (3; 11) wherein the larger extension of the beam cross section defines a line direction (4; 12) of the X-ray beam (3; 11), further comprising a sample (6; 13), and an X-ray detector (7) rotatable in a scattering plane around an axis &ohgr; intersecting the position of the sample (7) is characterized in that the X-ray source is mounted to a switching device (10), which allows to move the X-ray source into one of two fixed positions with respect to the scattering plane, wherein in the first position the line direction (4) of the X-ray beam (3) is parallel to the scattering plane and in the second position the line direction (12) of the X-ray beam (11) is perpendicular to the scattering plane, and wherein the path of the X-ray beam (3, 11) in the two fixed positions of the X-ray source is the same.

Abstract: An X-ray or neutron-optical system comprising an X-ray or neutron source (1) from which corresponding radiation is guided as a primary beam (2) to a sample (4) under investigation, with an X-ray or neutron detector (6) for receiving radiation diffracted or scattered from the sample (4), wherein the source (1), the sample and the detector are disposed substantially on one line (=z-axis) and wherein a beam stop (5; 31; 41) is provided between the sample and the detector whose cross-sectional shape is adjusted to the cross-section of the primary beam is characterized in that the beam stop is disposed to be displaceable along the z-direction for optimum adjustment of the amounts of useful and interfering radiation impinging on the detector. This protects the detector from the influence of the primary beam while allowing a maximum amount of diffracted or scattered radiation to reach the detector, wherein the beam stop can be easily adjusted to temporally changing properties of the beam optics.

Abstract: An X-ray optical system for combinatorial screening comprising a plurality of samples which are disposed on a flat plate (8;23) as a sample library (3;22), with an X-ray source (1) from which X-ray radiation (2) is guided to a sample under investigation, and an X-ray detector (7) for receiving radiation (6) diffracted or scattered on the sample, wherein a sample carrier is provided for displacing the flat plate (8;23) in its xy-plane and perpendicular thereto along a z-direction, is characterized in that the sample carrier is designed such that it can rotate the flat plate (8;23) about a first axis (9) parallel to the z-direction and also about a second axis (10) which extends through the xy-plane. This permits rapid sequential measurement of the samples of a sample library, wherein a large variety of X-ray analyses can be applied to the samples.

Abstract: An X-ray optical system comprising an X-ray source (1), from which X-ray radiation (2) is guided to a sample (4) under investigation, and an X-ray detector (7) for receiving radiation (5) diffracted or scattered from the sample (4), wherein a beam-guiding X-ray optical element (3, 6), such as e.g. a collimator, a mono- or polycapillary, an X-ray mirror or a monochromator, is disposed between the source (1) and the sample (4) and/or between the sample (4) and the detector (7), is characterized in that a wobble means is provided for moving the X-ray optical element (3, 6) in an oscillating fashion during the measurement. The inventive X-ray optical system obtains averaged X-ray analysis information from objects under investigation having large mass which consist of macrocrystalline material without destroying or accelerating the object under investigation.

Abstract: The invention concerns an X-ray analysis system for controlling the humidity of a sample, a method for its operation as well as a humidifying apparatus itself. The analysis system has means for dividing a gas flow stream into two portions and for emerging a membrane humidifier tube, containing one of the gas flows, in a water bath in which the gas passing through that tube is moisturized to a desired degree. The two gas flows are subsequently reunited at a controlled temperature to provide for combined moisturized gas at a desired temperature and humidity. The gas is then sprayed onto the sample and an excess moisturize gas vented from the chamber to maintain a moisturize gas sample without condensation of water on or near the sample.

Abstract: An X-ray diffractometer comprising an X-ray source (10) from which X-rays are guided to a sample (11) to be investigated, an X-ray detector (12) for receiving X-rays diffracted or scattered from or reflected by the sample (11), and a goniometer for adjustment of sequential relative angular positions between the X-ray source (10), the sample (11) and the X-ray detector (12) for detecting X-ray diffraction lines, X-ray scattered signals or X-ray reflectograms of the sample (11) to be investigated, wherein the X-rays can be guided at least sectionally along different optical paths, is characterized in that the X-rays can be guided from a position 1 to a position 2 along n≧2 different switchable optical paths, wherein the different optical paths are rigidly disposed relative to each other between position 1 and position 2 and form a unit (13), wherein the sample (11) assumes either position 1 or position 2 and wherein the switching over between the different optical paths can be effected by turning the unit (1

Abstract: An X-ray optical system with an X-ray source (Q) and a first graded multi-layer mirror (A), wherein the extension Qx of the X-ray source (Q) in an x direction perpendicular to the connecting line in the z direction between the X-ray source (Q) and the first graded multi-layer mirror (A) is larger than the region of acceptance (F) of the mirror (A) at a focus (Oa) of the mirror (A) in the x direction, is characterized in that a first collimator (bl) is disposed at a focus of the first graded multi-layer mirror (A) between the X-ray source (Q) and the mirror (A) whose opening in the x direction corresponds to the region of acceptance of the first graded multi-layer mirror (A) and the separation qzA between first collimator (bl) and X-ray source (Q) is: