Abstract: The present disclosure is related to improved systems and methods for inducing infrared multiphoton dissociation (IRMPD) of an ion.

Abstract: The present disclosure is related to improved systems and methods for delivering samples for high-throughput mass spectrometric analysis to an atmospheric-pressure ionization source. In an exemplary embodiment, the system includes a solvent reservoir for storing a solvent solution, a first valve which is coupled to the solvent reservoir, first and second pumps for delivering solvent solution and which are coupled to the first valve and which the delivery flow rate of the first pump is greater than the delivery flow rate of the second pump, an injection system having a sample injector and an second valve which is coupled to the first valve and which is capable of being coupled to can be couple to an electrospray ionization source. In another embodiment, the system can also include an atmospheric-pressure ionization chamber, an atmospheric-pressure ionization sprayer and a nebulizer gas source and a voltage supply source.

Abstract: The present invention relates to an apparatus and method for analyzing ions including an ion accelerator and one or more reflectrons positioned with respect to one another such that ions can be reflected back and forth between therebetween. The ion accelerator acts both to provide the initial acceleration of ions received from an ion source and to reflect these ions in the subsequent mass analysis. The reflectrons act only reflect ions in such a manner that all ions of a given mass-to-charge ratio have substantially the same flight time through the analyzer. During ion analysis, ions are reflected back and forth between the accelerator and the reflectrons multiple times, until, at the conclusion of the ion analysis, the accelerator is rapidly deenergized so as to allow the ions to pass through the accelerator and into a detector.

Abstract: The ionization chamber consists of a plurality of ports to accept multiple identical devices or varying devices. Ports may be arranged at various positions on the ionization chamber and at various angles with respect to the sampling orifice leading into the vacuum chamber of the mass spectrometer. A plurality of sprayers may operate in a time modulated manner and thereby the simultaneous multiplexed analysis of a multitude of samples is facilitated.

Abstract: The present invention relates generally to ion beam handling in mass spectrometers, arid more specifically to a method and apparatus for focusing ions in time-of-flight mass spectrometers (TOFMS). This invention focuses ions using one or more electrodes bound on at least one side by an electrically conducting grid. Electric fields generated by the electrodes focus the ions. With electric fields of the proper strength and geometry, ions may be focused onto a point some desired distance from the source. According to the preferred embodiment of the present invention, a shielded lens, in the form of an electrically conducting cylinder and two conducting grids, is used to produce and adjust the position of an ion focal point.

Abstract: The present invention relates to a means and method for decreasing the energy distribution of ions produced from solid or liquid samples by pulsed desorption method. More particularly, the present invention discloses a method wherein the kinetic energies of ions are related to their locations at a given time after the excitation event which caused their desorption. Based on this relationship between ion position and energy, an accelerating electric field is applied at a predetermined time after the excitation event. The magnitude of the applied electric field and the time of its application are such that the kinetic energy distribution of the ions is substantially reduced or eliminated.

Abstract: The present invention relates generally to time-of-flight mass spectrometers and discloses an improved method and apparatus for analyzing ions using a time-of-flight mass spectrometer. More specifically, the present invention comprises two or more electrostatic reflectors positioned coaxially with respect to one another such that ions generated by an ion source can be reflected back and forth between them. The first reflecting device is an ion accelerator which functions as both an accelerating device to provide the initial acceleration to the ions, and a reflecting device to reflect the ions in the subsequent mass analysis. The second reflecting device is a reflectron which functions only to reflect the ions in the mass analysis. During the mass analysis, the ions are reflected back and forth between the accelerator and reflectron multiple times.

Abstract: A method and apparatus for analyzing ions by determining times of flight include using a deflector to direct ions away from their otherwise intended or parallel course. Deflectors are used as gates, so that particular ions may be selected for deflection, while others are allowed to continue along their parallel or otherwise straight path, from the ion source, through a flight tube, and eventually, to a detector. According to the present invention, an extended Bradbury-Nielson gate, in the form of a series of plates, with equal but alternating opposite polarity potentials, is used as an ion deflector or gate.