Patents Assigned to BRUKER NANO
  • Nanoscale dynamic mechanical analysis via atomic force microscopy (AFM-nDMA)
    Patent number: 11307220
    Abstract: An atomic-force-microscope-based apparatus and method including hardware and software, configured to collect, in a dynamic fashion, and analyze data representing mechanical properties of soft materials on a nanoscale, to map viscoelastic properties of a soft-material sample. The use of the apparatus as an addition to the existing atomic-force microscope device.
    Type: Grant
    Filed: April 19, 2021
    Date of Patent: April 19, 2022
    Assignee: BRUKER NANO
    Inventors: Sergey Osechinskiy, Anthonius Ruiter, Bede Pittenger, Syed-Asif Syed-Amanulla