Patents Assigned to BWXT NOG Technologies, Inc.
  • Apparatus and method for inspection of a film on a substrate
    Patent number: 11237117
    Abstract: Methods of and apparatus for inspecting composite layers of a first material formed on a second material are provided including providing an illumination source, illuminating at least a portion of the composite at the layer, receiving light reflected from the sample, determining a spectral response from the received light, and comparing the received spectral response to an expected spectral response.
    Type: Grant
    Filed: August 31, 2020
    Date of Patent: February 1, 2022
    Assignees: BWXT Nuclear Operations Group, Inc., BWXT NOG Technologies, Inc.
    Inventors: Aaron C. Havener, James D. Jogerst, Thomas C. Mohr, Keith B. Rider
  • Apparatus and method for inspection of a film on a substrate
    Patent number: 10761032
    Abstract: Methods of and apparatus for inspecting composite layers of a first material formed on a second material are provided including providing an illumination source, illuminating at least a portion of the composite at the layer, receiving light reflected from the sample, determining a spectral response from the received light, and comparing the received spectral response to an expected spectral response.
    Type: Grant
    Filed: February 26, 2019
    Date of Patent: September 1, 2020
    Assignees: BWXT Nuclear Operations Group, Inc., BWXT NOG Technologies, Inc.
    Inventors: Aaron C. Havener, James D. Jogerst, Thomas C. Mohr, Keith B. Rider