Abstract: Provided are a method and an apparatus for testing AI chip computing performance, and a non-transitory computer-readable storage medium. The method includes: forming computing performance result data of a to-be-tested AI chip according to a plurality of items of simulation data formed in a development process of the to-be-tested AI chip; acquiring a function instruction set matched with a to-be-tested service function, wherein the function instruction set is composed of a plurality of instructions in a standard instruction set matched with the to-be-tested AI chip; and predicting computing time required by the to-be-tested AI chip to execute the to-be-tested service function according to the function instruction set and the computing performance result data.