Abstract: A portable electronic testing apparatus for examining the data at a selected address within a microprocessor system and with the microprocessor system including a receptacle for receiving a CPU having particular electrical connections. An electrical socket, having the particular electrical connections for receiving the CPU, provides electrical contact to the CPU when the CPU is removed from the microprocessor system and plugged into the electrical socket. A connector assembly is interconnected with the electrical socket with the connector assembly including a plug simulating the electrical connections of the CPU. The plug is plugged into the receptacle included in the microprocessor system after the CPU is removed from the microprocessor system so as to electrically reconnect the CPU within the operation of the microprocessor system. Address selection switches provide a selection of the address of data to be examined.