Abstract: Methods for debugging a failure in a logic circuit design simulation by tracing a X-value are provided. In one aspect, a method includes detecting during a X-propagation logic circuit design simulation a failure at a register transfer level of a logic circuit comprising one or more logic blocks and tracing a X-value in a data path of the one or more logic blocks until the X-value is observed in a control path of the one or more logic blocks. The method also includes identifying a logic block comprising a control signal of the control path in which the X-value is observed, and identifying the logic block in which the X-value is observed as a root cause of the failure. Systems and machine-readable media are also provided.

Abstract: The present embodiments relate generally to techniques for creating and/or modifying multi-layer buses in an IC design. According to some more particular aspects, embodiments relate to techniques for allowing an IC designer to efficiently transition a multi-layer bus section made of N wires and M layers to another multi-layer bus section made of N wires and any other M? layers. In some embodiments, the user describes, programmatically, one or several custom transitions called a custom transition procedure and saved in a human-readable text file that can also be read by a layout editor tool. By a command associated with the custom transition procedure that is exposed to the user in the layout editor tool, a multi-layer bus is automatically transitioned from a set of layers to another.

Abstract: A system, methods, and a computer program product for estimating a yield and creating corners of a circuit design with the aid of a failure boundary classification. The system, methods and computer program product provide for determining, based on how many sampling factors have failures, whether data samples are sufficient as input to scaled-sigma sampling. If the data samples are insufficient, the failure boundary classification is usable to determine whether the yield is high enough to meet a yield target. A design corner can be located by applying a binary search to results of scaled-sigma sampling. The failure boundary classification can aid in setting up the search.

Abstract: A control-circuit of an emulation system may include one or more serial link inputs communicatively coupled to a serial bus, a serial link input receiving an input control bit from the serial bus. A configurable logic circuit may be configured to receive multiple control bits from the one or more serial link inputs, execute one or more operations on the plurality of input control bits according to programmable logic, and transmit an output control bit to a serial output link.

Abstract: An integrated circuit test method provides an interactive shell environment having analysis modules organized as a directory such that for a given session a user can access any of the analysis modules. This invention describes a virtual directory structure for navigating through the entire test data starting from design, test configuration, ATPG patterns, failure information and callout information. This structure also allows the creation of a scripting environment for the user to select a specific configuration and process the information. User can achieve all of this in a single session as opposed to working on every test configuration in an independent session.

Abstract: Various embodiments provide for analyzing impedance states of a set of nodes in a circuit design and providing a set of reasons for those impedance states. The set of reasons can include a reason regarding why a particular node is reported as being in high-impedance (highz) state or in low-impedance (lowz) state, and the reason may be for a specific time point during transient analysis of the circuit design. Some embodiments are implemented within a debugging utility of an electronic design automation (EDA) software system.

Abstract: Aspects of the present disclosure address improved systems and methods for designing an integrated circuit design clock tree structure with scaled-load balanced clusters. Consistent with some embodiments, the system may include a clock tree synthesis (CTS) tool configured to recursively group pins to form a set of clusters that are balanced according to a scaled load. During the recursive grouping, the CTS tool scales actual loads of clusters in accordance with a scaling factor that is based on the radius of the cluster. In this way, the scaling factor penalizes large cluster spans during recursive clustering, thereby producing a clock tree structure that meets design rule constraints.

Abstract: An exemplary memory arrangement can be provided, which can include, for example, a memory(ies), and an algorithmic memory unit(s) (AMU) coupled to the memory(ies), wherein the AMU includes a programmed testplan algorithm(s) configured to test the memory(ies). The AMU(s) can further include a hardwired testplan(s) configured to test the memory(ies). A Joint Test Action Group (“JTAG”) controller may be coupled to the AMU(s), which can be configured to access logic of the programmed testplan algorithm(s). A direct access controller (DAC) can be coupled to the AMU(s), which can be configured to access internal nodes in the AMU(s). The DAC can be configured to activate the programmed testplan algorithm(s) using a minimally direct access pin interface in the AMU(s).

Abstract: According to certain aspects, the present embodiments relate to an inverse lithography technology (ILT) solution that provides masks with perfect symmetry and minimal complexity. A methodology according to the embodiments includes several steps and strictly maintains symmetry in each of these steps. In one step, lithographic model kernels are processed to enforce symmetry corresponding to an illumination source. In another step, an ideal grayscale mask for a target pattern is computed using the symmetrical model kernels and computation domain centered on each target polygon. In another step optimized polygons are computed using the computed grayscale mask. The final mask perfectly maintains the symmetry properties of the illumination source. An ILT solution according to the embodiments can be used on an original design hierarchy and on a full chip scale.

Abstract: A system and method are provided to control error-protected access to a memory device having address integrity protection for data words of memory transactions. A communication port receives a command having a port address, which is adaptively converted to a memory address by an interface portion. The interface portion includes an adaptation stage carrying out a predefined adaptation response on an address propagated therethrough during a clock cycle of operation. An address protection portion configures the adaptation stage to maintain the predefined adaptation response over at least two clock cycles. Address error is detected based on comparison of output addresses respectively generated upon iterative propagation of the same input address through the adaptation stage over the clock cycles. A command control portion executes to adaptively split each command received from the interface portion, as well as the corresponding memory address according to an inline storage configuration of the memory device.

Abstract: Disclosed herein are systems and methods to generate, by a compiling processor, one or more sets of one or more execution instructions responsive to compiling a netlist file. The method further includes storing, by the compiling processor, a set of execution instructions into an instruction memory of an execution processor. The method further includes generating, by a compiling processor, a set of one or more keephot instructions for the execution processor based upon the set of execution instructions stored into the instruction memory of the execution processor. The method further includes storing, by a compiling processor, the set of keephot instructions into the instruction memory of the execution processor.

Abstract: A method for simulating an integrated circuit design is provided. The method includes executing a characterization tool over a first portion of a parameter space of a circuit design to form a netlist associated with the first portion of the parameter space. The method also includes forming a first sub-netlist from the netlist, selecting, for the first sub-netlist, a condition from at least one of a process, a voltage, or a temperature condition, and at least one parameter from the first portion of the parameter space. The method further includes executing a simulation of the first sub-netlist in a selected solver mode using the condition and the at least one parameter, and incorporating a result of the simulation in a circuit performance report, wherein the result is associated with the condition, with the at least one parameter, and with the first sub-netlist.

Abstract: Various embodiments provide for a circuit for measuring a frequency difference, a phase difference, or both of at least two clock signals (e.g., a reference clock signal and a feedback clock signal). In particular, various embodiments described herein may be used in a circuit design to convert an input phase of two clock signals to a frequency difference, which may be outputted in the form of a digital word. Additionally, various embodiments described herein may be used in a circuit design to convert an input phase of two clock signals as phase difference output, which may be outputted in the form of a digital word. Various embodiments can provide the frequency difference, the phase difference, or both in near real-time and with only a small amount of latency.

Abstract: The present disclosure relates to a system and method for visualization of fixing of design rule violations in an electronic circuit design. Embodiments may include displaying at a graphical user interface at least a portion of an electronic design having at least one shape associated therewith and identifying one or more electronic design rules associated with the at least one shape. In response to identifying, embodiments may include determining a proposed shape based upon, at least in part, the one or more electronic design rules associated with the at least one shape, wherein the proposed shape is at least one of a trim shape, a bridge shape, and a patch shape and displaying the proposed shape at the graphical user interface.

Abstract: Methods and systems for implementing track pattern for electronic designs are disclosed. The method identifies a first track in a design and viable implementing options for the first track. When adding a second track to the track pattern, the method determines whether the second track corresponds to the viable implementing options for the track. The second track is inserted to the track pattern and situated immediately adjacent to the first track if the second track is determined to correspond to a viable implementing option for the first track. One or more intermediate tracks may be inserted immediately adjacent to the first track before inserting the second track to produce a legal track pattern. Tracks may be removed from a track pattern. One or more intermediate tracks may be inserted into the space occupied by a track being removed to ensure track pattern's compliance with design rules after the track removal.

Abstract: Various embodiments provide for determining a delay of a data signal with respect to a data strobe signal within a memory system comprising a memory controller and a memory module. In particular, some embodiments adjust a phase between a data signal and a data strobe signal such that a data eye of the data signal arrives at a receiver latch of a memory module can be centered on a transition of the data strobe signal. By centering the data eye of the data signal with the transition of the data strobe signal, various embodiments can ensure that the data strobe signal transition falls between the leading and trailing edges of the data eye, which in turn permits the memory module to obtain correct data from the memory controller during a write operation.

Abstract: A method for generating a validation test may include using a processor, identifying, in a scenario for validation testing, a plurality of actions that address a single resource in a conflicting manner; and automatically generating target code of the scenario that includes one or a plurality of resource management commands so as to prevent conflicting addressing of that resource by said plurality of actions.

Abstract: The present disclosure relates to a computer-implemented method for electronic design automation. Embodiments may include providing, using at least one processor, an electronic circuit design at a graphical user interface. Embodiments may further include associating one or more metrics with the electronic circuit design, wherein the one or more metrics include at least one of process metrics, design metrics, issues, library metrics, and custom metrics. Embodiments may further include allowing a user to specify one or more rules that define a key performance indicator for at least a portion of the electronic circuit design, wherein the key performance indicator is based upon, at least in part, the one or more metrics. After a design process associated with the electronic circuit design has been initiated, embodiments may include displaying the key performance indicator at the graphical user interface.

Abstract: Various embodiments provide for clustering pins of a circuit design for connection to a power-ground network (PG) of the circuit design using a nearest neighbor graph. Pin clustering, according to some embodiments, can minimize wirelength, minimize a number of vias, satisfy constraints relating to a pin count (e.g., maximum number of pins per power-ground access point), and satisfy constraints relating to a bounding box size.

Abstract: Aspects of the present disclosure address improved systems and methods for local cluster refinement during clock tree synthesis for integrated circuit designs. In accordance with some embodiments, the methods for local cluster refinement may include pin move refinement and local reclustering. With pin move refinement, pins are moved from clusters that fail to satisfy design rule constraints to nearby clusters that satisfy design rule constraints. With local reclustering, groups of neighboring clusters that fail or nearly fail to satisfy design rule constraints are dissolved and corresponding pins are regrouped to form new clusters that satisfy design rule constraints.