Abstract: A method is provided to evaluate whether one or more test patterns is power safe for use during manufacturing testing of an integrated circuit that includes a nonuniform power grid and that includes a scan chain, the method comprising: assigning respective toggle count thresholds for respective power grid regions of the non-uniform power grid; and determining whether respective numbers of toggles by scan elements of the scan chain within one or more respective power grid regions meet respective toggle count thresholds for the one or more respective regions during at least one scan-shift cycle in the course of scan-in of a test pattern to the scan chain.

Abstract: An invention is provided for wear leveling in a non-volatile memory system utilizing relative wear counters to indicate relative levels of wear for each memory block in a non-volatile memory system. Whenever a memory block is erased, the associated relative wear counter is incremented. Then, when any relative wear counter reaches a predetermined limit, the value of the lowest relative wear counter is subtracted from each relative wear counter. Thus, each relative wear counter indicates a relative wear level of the associated memory block relative to other memory blocks. In this manner, the relative wear levels are maintained while reducing the amount of memory needed to for each relative wear counter.

Abstract: An automated system and method for determining flip chip connections involves generating a first projection that includes representations of bumps arranged over a core of the flip chip and generating a second projection that includes representations of I/O pads arranged around the core. The first projection is generated by drawing a line through each bump between a location of the flip chip and an outer portion of the flip chip and marking a location where the line terminates at the outer portion with a representation of the bump. The outer portion of the flip chip is traversed, and the first projection is generated based on the order in which bump representations are encountered. The second projection is generated by drawing a line through each I/O pad between a location of the flip chip and an outer portion of the flip chip and marking a location where the line terminates at the outer portion with a representation of the I/O pad.

Abstract: A combined language-compiler that provides for the efficient compilation process of hybrid computer code written using a plurality of computer languages by splitting the hybrid code in such a way that each code statement is optimally independently compliable. The designer specifies both computation and communication between different hybrid code modules.

Abstract: The present invention provides a system and method for resolving a test generation problem involving constraint resolution problems where a verification environment includes constraints that are suitable for resolution using one type of solver for a first domain and other constraints that are suitable for resolution using a different solver in a second domain. The invention further comprises variables and, in instances where at least one variable is in each of the first and second domains, using these solvers to restrict the set of permissible values of variables to be consistent in multiple domains, preferably in all relevant domains. A constraint resolution problem is divided into clusters of constraints connected within a domain, and connected clusters of clusters that are connected through shared variables that are subject to constraints in more than one cluster.

Abstract: A system and method of managing external content that is used within a software product or software development process is disclosed. In some approaches, the system and method manages and tracks the use of external content, as well an approval process for determining whether the external content is to be used or incorporated. The system and method manages and tracks compliance with terms and restrictions of the external content.

Abstract: A method and system for resolving circuit and network parameters. A circuit evaluation system includes a plurality of nodes and a plurality of resolution devices. Each node is connected to a resolution device via a bi-directional connection, and at least one node is configured to receive data from an input. Each enabling element is associated with a resolution device. Enabling elements that are associated with resolution devices that are connected to nodes that are configured to receive input data are activated, thereby enabling certain resolution devices. The enabled resolution devices are executed using data in the nodes that are connected to the enabled resolution devices. Iterations of executing resolution devices are performed until stable node values are determined.

Abstract: An improved method and system for performing extraction on an integrated circuit design is disclosed. Extraction can be performed at granularities much smaller than the entire IC design, in which a halo is used to identify a geometric volume surrounding an object of interest to identify neighboring objects and generate an electrical model. The extraction approach can be taken for Islands, Nets, as well as other granularities within the design. Re-extraction of a design can occur at granularities smaller than a net. Some approaches utilize Island-stitching to replace an island within a net. An approach is also described for improving cross-references for cross-coupled objects.

Abstract: Features are provided for graphically representing constraints on design objects in an Electronic Design Automation tool. A particular constraint on one or more circuit objects is displayed as a highlighted region that extends to each visible circuit object to which the constraint applies. Attributes of the highlighted region, such as density and thickness, may proportionally represent attributes of the constraint, such as a strength or distance specified by the constraint. The highlighted region is superimposed on or around circuit objects. The highlighted region may be a halo, which is a partially transparent region filled with a color. Multiple regions that represent the same type of constraint or relationship are connected by line segments, providing the ability to visualize groups of constrained objects, including groups that span levels of a hierarchical design. Intersecting highlighted regions are blended together using techniques such as alpha blending.

Abstract: Disclosed is a method, system, and article of manufacture for a one-pass approach for implementing metal-fill for an integrated circuit. Also disclosed is a method, system, and article of manufacture for implementing metal-fill that is coupled to a tie-off connection. An approach that is disclosed comprises a method, system, and article of manufacture for implementing metal-fill having an elongated shape that corresponds to the length of whitespace. Also disclosed is the aspect of implementing metal-fill that matches the routing direction. Yet another disclosure is an implementation of a place & route tool incorporating an integrated metal-fill mechanism.

Abstract: A methodology is provided to perform noise analysis in the implementation stage of the design of an integrated circuit, and based upon analysis results, a floorplan may be adjusted or guard rings may be inserted to reduce the impact of digital switching noise upon noise sensitive circuits.

Abstract: For increasing user control and insight into preparing a mixed-signal semiconductor design specification for simulation, there are provided methods responsive to commands that provide control over resolution of disciplines and partitioning of the design into analog and digital portions. In some aspects, the methods provide block-based assignment of disciplines, as well as design partitioning. In other aspects, the methods provide for resolving a discipline to apply in a block from among multiple possible disciplines. In some aspects, error flagging may be available for detecting disciplines different from what provided for assignment in a block. Assignments may be indicated based on instance, cell, terminal, or library names and may be specified with wild cards. In still other aspects, the methods may be embodied by instructions on computer readable media, and in systems comprising general and special purpose computer hardware that may communicate with various storage facilities and over various networks.

Abstract: Some embodiments provide a method and system for identifying error markers for patterns within a design layout that do not meet the manufacturing constraints. Some embodiments extend a region from the error marked region to extract a pattern for decomposition analysis. Some embodiments compare the extracted pattern to known patterns stored in a library, which also stores at least one previously computed decomposition solution for each known pattern. For an extracted pattern existing within the library, some embodiments retrieve the previously computed decomposition solution from the library. For an extracted pattern that does not exist within the library, some embodiments use one or more simulations to determine a decomposition solution for the extracted pattern. The resulting decomposition solution replaces the extracted pattern within the design layout producing a variant of the original layout that contains the decomposed solution for the pattern.

Abstract: Methods, software, and systems implementing software provide for accepting a user's selection of a database object defining layout being displayed. The database objects can include objects defining paths and path segments. Automatic layout tools may be used in creating at least some of the objects. The user's selection begins a recursive process of automatically selecting additional database objects based on criteria designed to create an uninterrupted spine from database objects on a single interconnect layer, of the same width, and collectively arranged such that the spine has a first end and a second end, and can be traced from the first end to the second end without backtracking.

Abstract: Disclosed is a method, system, and computer program product for implementing model-based floorplanning, layout, placement, and routing. Models are used to guide the placement and routing of polygons on the IC layout based upon predictions of manufacturing variations.

Abstract: Techniques are provided to allow users of Electronic Design Automation (EDA) tools to define constraint template types for efficiently associating constraints with design objects to specify design intent. Processes for creating and validating the constraints are provided by user-defined plug-ins, thereby allowing users to annotate circuit designs with constraints for proprietary layout and fabrication processes without exposing the constraints to tool vendors or competitors. The constraints are re-created from the template types whenever the circuit design is loaded into the EDA tool, so that the constraints are based upon the latest version of the template type. The constraints are also re-created when validation fails. Constraint groups are reusable in different designs, technology nodes, and processes because they automatically expand to provide the specific constraints to achieve a goal.

Abstract: Disclosed are a method, a system, and a computer program product for implementing hotspot detection, repair, and optimization of an electronic circuit design, which, in some embodiments, defines, identifies criteria for hotspots/metrics or optimization objective function; performs the initial hotspot or metric prediction; identifies correction candidate(s); applies a correction candidate to the electronic circuit design; and determines whether the outcome of applying the correction candidate is acceptable. The method or the system identifies custom correction candidate(s) or custom command(s) and identifies one or more hints for the predicted hotspots or metrics; provides a single architecture to use a first model for hotspot identification/correction and a second model for design check; and provides the capability to apply a correction for a hotspot or metric, evaluate the effectiveness of the correction on the fly, and revert any changes made to the electronic circuit design by the correction.

Abstract: Systems, methods, and computer readable media storing instructions for such methods relate to generating test vectors that can be used for exercising a particular area of interest in an integrated circuit. The test vectors generally include a non-overlapping repeating and/or predictable sequence of care bits (a care bit pattern) that can be used by a tester to cause the exercise of the area and collect emissions caused by exercising the area. Such emissions can be used for analysis and debugging of the circuit and/or a portion of it. Aspects can include providing a synchronization signal that can be used by a tester to allow sensor activation at appropriate times.

Abstract: A method, system, and computer program product are disclosed for performing RC extraction. The present approach can consider multiple types of manufacturing processes, and allows location-based prediction data to be used in the context of net-based analysis. RC extraction can be more accurately performed based upon net-specific top and bottom adjustments to thickness prediction that are location-based. The net-based prediction data can be used for other purposes as well, such as to perform electrical hotspot analysis, to visually display physical properties of the nets, or allow queries for other data analysis purposes.

Abstract: Various embodiments of the invention provide systems and methods for semiconductor device fabrication and generation of photomasks for patterning a target layout of line features and large features. Embodiments of the invention are directed towards systems and methods using self-aligned double pattern to define the target layout of line features and large features.