Abstract: This application is directed to a bias circuit. The bias circuit includes a biasing voltage reference circuit including at least a first transistor. The biasing voltage reference circuit is configured to output a first voltage that depends on a threshold voltage of the first transistor. The bias circuit also includes a differential input circuit coupled to the biasing voltage reference circuit and having two differential inputs. The differential input circuit is configured to receive the first voltage and a reference voltage and generate a second voltage based on a difference between the first voltage and the reference voltage. The bias circuit further includes a buffer circuit coupled to the differential input circuit. The buffer circuit is configured to receive the second voltage and generate a bias voltage based on the second voltage. The bias voltage depends on the threshold voltage of the first transistor.

Abstract: Systems, apparatuses, and associated methods are provided for testing, analyzing, and assembling radiofrequency (RF) modules. An example system includes a test station for testing an RF module, including testing mechanical, chemical, and/or electrical parameters of the RF module. The testing may involve various sources of error, and the system determines one or more types of error from the test results as well as how to address the error. From completed testing, test results may be utilized in view of expected test results to improve simulations and to determine how two or more RF module may be combined in an RF assembly.

Abstract: Systems, devices, and associated methods are provided for testing and tuning devices under test (e.g., radiofrequency modules). An example system includes a test station including an imaging device, a measurement device, and a robotic arm. The system may include a rotary stage coupled with the robotic arm, measurement probes disposed in the rotary stage and operably coupled with the measurement device, and tuning tips disposed in the rotary stage. The system may include a galvo scanner and laser to remove conductive material. The test station may perform a testing procedure on an RF module where the measurement probes generate testing data indicative of testing parameters. The test station may perform a tuning procedure on the RF module where a tuning tip or the laser modifies the RF module based on the testing parameters. The testing and tuning may be performed by a user, semi-autonomously, or autonomously.

Abstract: An antenna array includes one or more antenna tiles which are arranged on an antenna plane. Each of the one or more antenna tiles includes one or more antenna units that are arranged together to form the respective antenna tile having a hexagonal shape and each antenna unit comprises an antenna circuit chip. In some embodiments, each antenna unit has a pentagonal shape and the antenna tile has a hexagonal shape formed by tessellating the one or more antenna units with one another.

Abstract: Systems, devices, and associated methods are provided for testing and tuning radiofrequency (RF) modules. An example system includes a test station including an imaging device, a measurement device, and a robotic arm. The system may include a rotary stage coupled with the robotic arm, measurement probes disposed in the rotary stage and operably coupled with the measurement device, and tuning tips disposed in the rotary stage. The system may include a galvo scanner and laser to remove conductive material. In operation, the test station may perform a testing procedure on an RF module where the measurement probes generate testing data indicative of testing parameters. The test station may perform a tuning procedure on the RF module where a tuning tip or the laser modifies the RF module based on the testing parameters. The testing and tuning may be performed by a user, semi-autonomously, or autonomously.

Abstract: Systems, devices, and associated methods are provided for testing and tuning radiofrequency (RF) modules. An example system includes a test station including an imaging device, a measurement device, and a robotic arm. The system may include a rotary stage coupled with the robotic arm, measurement probes disposed in the rotary stage and operably coupled with the measurement device, and tuning tips disposed in the rotary stage. The system may include a galvo scanner and laser to remove conductive material. In operation, the test station may perform a testing procedure on an RF module where the measurement probes generate testing data indicative of testing parameters. The test station may perform a tuning procedure on the RF module where a tuning tip or the laser modifies the RF module based on the testing parameters. The testing and tuning may be performed by a user, semi-autonomously, or autonomously.

Abstract: Systems, devices, and associated methods are provided for testing and tuning radiofrequency (RF) modules. An example system includes a test station including an imaging device, a measurement device, and a robotic arm. The system may include a rotary stage coupled with the robotic arm, measurement probes disposed in the rotary stage and operably coupled with the measurement device, and tuning tips disposed in the rotary stage. The system may include a galvo scanner and laser to remove conductive material. In operation, the test station may perform a testing procedure on an RF module where the measurement probes generate testing data indicative of testing parameters. The test station may perform a tuning procedure on the RF module where a tuning tip or the laser modifies the RF module based on the testing parameters. The testing and tuning may be performed by a user, semi-autonomously, or autonomously.