Patents Assigned to Canon Kabushuki Kaisha
  • Patent number: 7456934
    Abstract: An exposure apparatus configured to expose a substrate via a reticle includes a light source emitting light, a measuring device performing measurement of a wavelength spectrum of the light emitted from the light source, and a controller. The controller calculates a central wavelength of the light emitted from the light source based on the wavelength spectrum measured by the measuring device, calculates a difference between the calculated central wavelength and a central wavelength set to the light source for the measurement, and updates the central wavelength to be set to the light source based on the calculated difference.
    Type: Grant
    Filed: October 23, 2007
    Date of Patent: November 25, 2008
    Assignee: Canon Kabushuki Kaisha
    Inventor: Tadahiro Asaishi
  • Publication number: 20020180814
    Abstract: A recording apparatus has a recording head has a data generating unit that converts information transmitted from an external device into recording data that matches the configuration of the recording head for recording by the recording head. The recording apparatus has a first power supply circuit for supplying drive power to a drive element that drive by the nozzles of the recording head and a second power supply circuit that drives the heating elements that control recording by the nozzles. As a result, the recording apparatus can provide stable recording, unaffected by any voltage drop in the circuitry that drives the recording head.
    Type: Application
    Filed: May 28, 2002
    Publication date: December 5, 2002
    Applicant: CANON KABUSHUKI KAISHA
    Inventor: Yasuyuki Tamura
  • Patent number: 4515452
    Abstract: A data inserting device for a camera arranged to automatically insert data in response to an insertion trigger signal from the camera body includes abnormity detecting means which supplies current to a specific part where such abnormity that hinders the data inserting action tends to occur and is arranged to detect the abnormity by an impedance change occurred at the part, and external display means for displaying the abnormity upon detection thereof by the detecting means.
    Type: Grant
    Filed: February 13, 1984
    Date of Patent: May 7, 1985
    Assignee: Canon Kabushuki Kaisha
    Inventor: Hiroyoshi Tsuzuki