Abstract: The invention is a contour standard, which consists of a body having a rotationally symmetrical calibration region. The rotationally symmetrical calibration region encompasses a plurality of non-cylindrical axial sections, which can be concave, convex, by forming a predefined angle as radial projection or as radial depression. The calibration region has at least one measuring section, which runs parallel to the longitudinal axis of the body and which provides for axial calibration variables, as well as radial calibration variables. These calibration variables are compared with the sensed values to the calibration of a measuring instrument and the measuring instrument is adjusted based on the basis of the determined deviation. Due to the rotationally symmetrical calibration region, the contour standard is suitable both for the calibration of touch contour measuring instruments and also for the calibration of contour measuring instruments, which measure optically.

Abstract: A method for ascertaining the position of an edge in or on an object surface region of interest by optical scanning. The reflectivity of the object surface region is evaluated. Light is emitted onto the object surface region under different illumination conditions, in particular different light incidence directions, and in each illumination condition a sequence S1 to Sn of camera images B is recorded. Each camera image B of a sequence S1 to Sn is recorded at another illumination intensity I. Subsequently in each case one reflectivity image R1 to Rn is produced from a plurality of or from all camera images B of a sequence S1 to Sn. Thereafter, a resulting reflectivity image E is produced from a plurality of or from all reflectivity images R1 to Rn by weighted addition, in which resulting reflectivity image E the position of an edge is determined.

Abstract: In a measuring system comprising an optical image recording system and a relative movement between the measured object and the image recording system, it is provided that the focal point (F) of the image recording system (3) be allowed to oscillate in scanning direction in order to generate—by superimposition of the oscillation movement of the focal point with the scanning movement—image recording intervals, during which the focal point (F) stops on the surface of the measured object (2) or, correspondingly, the image projected on the camera chip (7) stops on the camera chip. This preferably occurs during a steady unaccelerated relative movement between the measured object and the image recording system. Blurring of the edges of the images is avoided despite relatively long exposure times and moderate illumination intensities.

Abstract: The apparatus and method according to the invention includes an objective (8) which is capable of operating basically in two different measuring modes. In a first interference mode, a measuring object (9) is interference—optically measured. In a second imaging operating mode on a detector array (12) designed like a camera, an optical image is generated, which is supplied to an image processing routine. The switching over between the two operating modes occurs by switching the illumination devices which are associated with different locations of the beam path of the apparatus—when viewed from the camera, one in front of a beam divider and the other behind the beam divider, which couples a reference light path to the beam path.

Abstract: An elevation measuring device comprises a measuring column at which a vertically movable measuring slide is supported, so it can be moved by hand and also by a drive motor through a clutch device. The measuring slide supports a scan head, which imparts a constant measuring force onto the measuring location at the work piece, which is generated by the drive motor and the clutch device. A measuring system detects the elevation coordinate of the scan head and hands said elevation coordinate to a control device for further processing and evaluation. The control device comprises logic for automating the measuring process. This logic automatically detects a positioning of the scan head in a certain direction, which is manually performed by the operator, subsequently controls the drive motor in a suitable manner in order to cause a scanning of the work piece and determines the measurement values.

Abstract: A first thread feature is measured by detecting with an optical sensor 2 light that reaches from a light source 21 located on the opposite side of a pipe axis and runs substantially in parallel to thread grooves A4. A contact probe 31 of a contact sensor 3 is contacted with a thread flank surface A8 to detect the space coordinates of the contact probe 31 at the time of contact, so that a second thread feature is measured. The first and second thread features thus detected are combined with each other by a processor 4, and thread features of the thread provided as a measurement object are thereby calculated.

Abstract: In a roughness scanner comprising a scanning arm with a scanning needle mounted at one end thereof, a skid carrier having an end supporting a skid with the scanning arm extending along the skid carrier in spaced relationship therefrom, the skid has at one side a guide late including an opening through which the scanning needle extends and a space formed above the guide plate which space is open at least at one side thereof down to the guide plate, so that any liquid collected by the needle and moving upward into the space above the guide late can flow again out of that space.

Abstract: A method for detecting shapes based on interferometric observation of an object surface subjected to narrow-band lighting. Movement of the interferometer (1) relative to the object surface (2) generates a measuring signal on a photo receiver, e.g., camera circuit (5), from which two extremely closely positioned signal frequencies (fo) and (fo+?f) are extracted. The phase difference between the two signal components is used for determining the distance and/or the change in distance. The method has a large unambiguousness range, making it possible to have a large depth measurement range, and can be used for workpieces having offset areas on the surface, wherein the measurement is not disturbed along the edges and the offset areas. The method also allows examining strongly inclined surfaces having a steep inclination such that that traditional methods based on evaluating interference lines cannot be used because of a high density of the interference lines.

Abstract: A method for detecting shapes based on interferometric observation of an object surface subjected to narrow-band lighting. Movement of the interferometer (1) relative to the object surface (2) generates a measuring signal on a photo receiver, e.g., camera circuit (5), from which two extremely closely positioned signal frequencies (fo) and (fo+?f) are extracted. The phase difference between the two signal components is used for determining the distance and/or the change in distance. The method has a large unambiguousness range, making it possible to have a large depth measurement range, and can be used for workpieces having offset areas on the surface, wherein the measurement is not disturbed along the edges and the offset areas. The method also allows examining strongly inclined surfaces having a steep inclination such that that traditional methods based on evaluating interference lines cannot be used because of a high density of the interference lines.

Abstract: A method for detecting shapes based on interferometric observation of an object surface subjected to narrow-band lighting. Movement of the interferometer (1) relative to the object surface (2) generates a measuring signal on a photo receiver, e.g., camera circuit (5), from which two extremely closely positioned signal frequencies (fo) and (fo+?f) are extracted. The phase difference between the two signal components is used for determining the distance and/or the change in distance. The method has a large unambiguousness range, making it possible to have a large depth measurement range, and can be used for workpieces having offset areas on the surface, wherein the measurement is not disturbed along the edges and the offset areas. The method also allows examining strongly inclined surfaces having a steep inclination such that that traditional methods based on evaluating interference lines cannot be used because of a high density of the interference lines.

Abstract: The apparatus according to the invention comprises an object lens which can operate in at least two different measuring modes. In a first, interference mode a workpiece is measured by means of interference optometry. In a second, imaging measuring mode an optical image is produced, for example, on a camera-like detector array and may be applied to an image processing routine. Switching between the two measuring modes is performed by the type of illumination of the object lens and an element which is disposed preferably in the reference beam path of an interferometer and which activates or deactivates the reference beam path dependent on the spectral composition of the utilized light. In this manner a simple and rapid changeover between the two measuring modes is provided, without the need for replacing or even for moving the object lens.

Abstract: A measuring head (4) according to the invention comprises the combination of a zone lens (26), which is preferably a diffractive lens, with a hemispherical lens (23) or a GRIN lens (33). This represents a concept capable of miniaturization, resulting in very slender measuring heads (4) having a high numeric aperture and, accordingly, leads to the best resolution capacity. Such measuring heads are insensitive to angular errors as concerns the orientation of the measuring head to the surface to be measured or to an oblique positioning of the surface relative to the optical axis of the measuring head.

Abstract: A micrometer screw gauge comprises a divided measuring spindle. The gauge's front part representing the measuring screw is secured in a torque-proof manner in a guide element. The rear section configured as a threaded spindle has the same diameter. In so doing, it is coupled in an axially rigid but rotatable manner to the measuring screw. This measuring spindle may replace a conventional, rigid, continuous measuring spindle of a micrometer screw gauge and, in so doing, results, without substantial design change, in a micrometer screw gauge comprising a non-rotatable measuring spindle.

Abstract: A measuring device (1) for measuring the shape, contour and/or roughness of a workpiece is based on a contact-less optical probe having a large numeric aperture. The probe has at least two different focal points with which at least two photo receptors are associated. The latter generate a differential signal for controlling a positioning device (13) for tracking the optical probe in such a manner that the workpiece surface is maintained within the measuring range of the probe. The differential signal is proven to result in a rapid and accurate tracking of the position of the sensor arrangement (3).

Abstract: The roughness measuring instrument (1) has a receiving device (2) for a feeder device (3), which serves to drag a roughness sensor (4) over a workpiece surface. The receiving device (2) carries a testing standard (24) with a testing face (25) within range of the roughness sensor (4). Preferably, the testing standard (24) is located in a pocket affixed to the receiving device (2), and this pocket is embodied in the wall of a bore for receiving the feeder device (3). Its testing face (25) is thus located inside the receiving device (2) in a way that is protected against becoming soiled and damaged yet is readily accessible.

Abstract: A measuring device (1) for measuring the shape, contour and/or roughness of a workpiece is based on a contact-less optical probe having a large numeric aperture. The probe has at least two different focal points with which at least two photo receptors are associated. The latter generate a differential signal for controlling a positioning device (13) for tracking the optical probe in such a manner that the workpiece surface is maintained within the measuring range of the probe. The differential signal is proven to result in a rapid and accurate tracking of the position of the sensor arrangement (3).

Abstract: An interferometric measuring method for detecting shapes is based on the interferometric observation of an object surface subjected to narrow-band lighting. A movement of the interferometer (1) relative to the object surface (2) generates a measuring signal on a suitable photo receiver, for example a camera circuit (5), from which two extremely closely positioned signal frequencies (f0) and (f0+?f) are extracted. The phase difference between the two signal components is used for determining the distance and/or the change in the distance. The method has a large unambiguousness range, thus making it possible to have a large depth measurement range. The method can also be used for workpieces having offset areas on the surface, wherein the measurement is not disturbed along the edges and the offset areas of the body.

Abstract: The roughness measuring instrument (1) has a receiving device (2) for a feeder device (3), which serves to drag a roughness sensor (4) over a workpiece surface. The receiving device (2) carries a testing standard (24) with a testing face (25) within range of the roughness sensor (4). Preferably, the testing standard (24) is located in a pocket affixed to the receiving device (2), and this pocket is embodied in the wall of a bore for receiving the feeder device (3). Its testing face (25) is thus located inside the receiving device (2) in a way that is protected against becoming soiled and damaged yet is readily accessible.

Abstract: A distance measuring instrument has a measuring axis; a measuring spindle disposed rotatably and shiftably in a housing such that a rotary motion of the measuring spindle results in a corresponding shift of the measuring spindle along the measuring axis; a stationary sensor element which is immobile relative to the housing and a movable sensor element which is connected to the measuring spindle to rotate therewith and which is shiftable relative to the measuring spindle along the measuring axis; and a guiding device for guiding the relative shifting motion between the movable sensor element and the measuring spindle, and having a guiding sleeve connected to the movable sensor element for rotation therewith; the guiding sleeve has an inner groove which extends parallel to the measuring axis and a guiding member which is connected to the measuring spindle for rotation therewith and which projects shiftably into the inner groove.

Abstract: A distance-measuring precision instrument has a threaded measuring spindle supported in a housing, a sensor device which detects the rotary motion of the measuring spindle and which has a stationary sensor element immobile relative to the housing and a movable sensor element secured to the measuring spindle for rotation therewith. Between the two sensor elements a clearance of predetermined width is provided. The instrument further includes a driving and guiding device for transmitting the rotary motion of the measuring spindle to the movable sensor element and for guiding a relative translational movement between the two. According to the invention the driving and guiding device has a guiding sleeve which is affixed to the movable sensor element for rotation therewith and which is provided with an inner groove extending parallel to the measuring axis. The device further includes a guiding member coupled to the measuring spindle for rotation therewith.