Abstract: For a confocal scanning electron microscope (1) an optical zoom system (41) is provided, which not only makes a zoom function possible, in that a variable magnification of an image is possible, but rather which additionally produces a pupil image in the illuminating beam path (IB) [BS] and thereby makes a variable imaging length possible (distance between the original pupil (En.P) [EP] and the imaged/reproduced pupil (Ex.P) [AP]) so that axially varying objective pupil positions can thereby be compensated.

Abstract: An integral apparatus for testing twilight vision and glare sensitivity and a method for operating the apparatus. The abstract of the disclosure is submitted herewith as required by 37 C.F.R. §1.72(b). As stated in 37 C.F.R. §1.72(b): A brief abstract of the technical disclosure in the specification must commence on a separate sheet, preferably following the claims, under the heading “Abstract of the Disclosure.” The purpose of the abstract is to enable the Patent and Trademark Office and the public generally to determine quickly from a cursory inspection the nature and gist of the technical disclosure. The abstract shall not be used for interpreting the scope of the claims. Therefore, any statements made relating to the abstract are not intended to limit the claims in any manner and should not be interpreted as limiting the claims in any manner.

Abstract: The invention is directed to an immersion microscope objective. An objective of this kind has an adjusting element, for example, a correction ring, by which it can be adjusted to different immersion media. In an advantageous manner, the objective can also be adjusted to different temperatures of the solutions and different coverslip thicknesses of object vessels by the correction ring.

Abstract: Arrangement for microscopic observation and/or detection of a sample that is at least partially transparent by way of a microscope objective, whereby an illumination of the sample outside the objective is carried out from at least from one side at an angle to the optical axis of the objective and the illumination light is focused on the sample with a smaller aperture than that of the viewing objective and that a coupling of the illumination light over a beam splitter, preferably in the objective pupil, is carried out for coupling, at its circumference, slightly expanding transmitting or reflecting areas for steering the illumination light to the sample, but otherwise is designed so that it is reflecting or transmitting for the sample light on the rest of the area.

Abstract: Procedure for the image acquisition of objects by means of a light raster microscope, whereas a scanning of the probe for the creation of a probe image occurs in scanning steps and the distance between at least two scanning steps is variably adjustable and at least a second scanning of the probe occurs, during which the position of the scanning steps is shifted with regard to the scanning direction, whereas preferably a line by line scanning of the probe is carried out.

Abstract: Arrangement for microscopic observation and/or detection of a sample that is at least partially transparent by way of a microscope objective in a light scanning microscope with line-shaped illumination, whereby an illumination of the sample outside the objective is carried out from at least from one side at an angle to the optical axis of the objective and the illumination light is focused on the sample with a smaller aperture than that of the viewing objective and that a coupling of the illumination light over a beam splitter, preferably in the objective pupil, is carried out for coupling, at its circumference, slightly expanding transmitting or reflecting areas for steering the illumination light to the sample, but otherwise is designed so that it is reflecting or transmitting for the sample light on the rest of the area.

Abstract: Procedure for the image acquisition of objects by means of a light raster microscope with line by line scanning, whereas a scanning of the probe for the creation of a probe image occurs in scanning steps and the distance between at least two scanning steps is variably adjustable and at least a second scanning of the probe occurs, during which the position of the scanning steps is shifted with regard to the scanning direction, whereas preferably a line by line scanning of the probe is carried out.

Abstract: Adjustable pinhole, particularly for the illumination beam path and/or detection beam path of a laser scanning microscope, wherein the pinhole is defined by foil edges which are adjustable relative to one another, and at least two foils, each with at least one straight edge, are advantageously arranged relative to one another and/or connected to one another in such a way that their edges describe an L-shape and the L-shaped connection pieces are arranged on one another in such a way that they define a rhombic or square light passage and they are moved relative to one another for adjusting the pinhole.

Abstract: Laser-scanning microscope with at least one detection radiation input, in which an aperture plate is installed in front of the detector, whereby optics with variable transmission lengths and a fixed focal distance is provided for focusing varying wavelengths of the detected light onto the aperture plate level at the detection radiation path, which realizes the imaging from the infinite space into an image level with a finite conjugate distance, and/or with at least one light source launched via an optical fiber, whereby collimator optics with a fixed focal distance, and a variable conjugate distance are down-streamed from the fiber output, which transfers the point source at the fiber output with a numerical aperture into a parallel beam in the infinite space in front of the scan-objective lens, whereby a wavelength-dependent, at least partial compensation of the chromatic distortion of the micro-objective lenses occurs by means of turning the chromatic curve for the illumination wavelength used.

Abstract: In a light raster scanning microscope with illumination arrangement (2) in the form of a line which provides an illumination beam for the illumination of a sample (23) in the form of points or point groups, a scanning arrangement (3, 4) which guides the illumination beam in the form of points or point groups over the sample in a manner so as to scan, a spot detector arrangement (5) which images, via the scanning arrangement (3, 4), the illuminated point or point group spot of the sample (23) by means of at least one confocal aperture (26) on at least one detector unit (28), and a control unit which controls the scanning arrangement (3, 4) and reads out the spot detector arrangement (5), it is provided that, in addition, a wide-field illumination source (29, 34) is provided which illuminates the sample (23) and that the control unit controls the scanning arrangement (3, 4) during the operation of the wide-field illumination source (29, 34) and reads out the spot detector arrangement (5) in such a manner that a

Abstract: Microscope, in particular optical scanning microscope with illumination of a specimen via a beam splitter, which is arranged in an objective pupil and consists of at least a reflecting first portion and at least a transmitting second portion, whereby the reflecting portion serves to couple in the illumination light and the transmitting portion serves to pass the detection light in the detection direction or the transmitting portion serves to couple in the illumination light and the reflecting portion serves to couple out the detection light, with a first scanning arrangement, whereby means are provided in the detection light path for the overlay of at least one further scanning arrangement for illumination and detection.

Abstract: Method and arrangement for changing the spectral composition and/or intensity of illumination light and/or specimen light in an adjustable manner, wherein a spatial separation into radiation components of different polarization is carried out with a first polarizing device, a spectral, spatial splitting of at least one radiation component is carried out with first dispersion device, the polarization state of at least one part of the spectrally spatially split radiation component is changed, and a spatial separation and/or combination of radiation components of different polarization are/is carried out by a second polarizing device, wherein a spatial combination of radiation components which are changed and not changed with respect to their polarization state is advantageously carried out by a second dispersion device.

Abstract: A correction device for an imaging optical arrangement exhibiting a light path (1), in particular for a microscope, that exhibits at least one plane-parallel transparent plate (9), which is held in a mounting plate in the image beam path (1) and is propelable around at least one axle in a tipping and/or a swiveling motion, in order in adjust a definite parallel misalignment of the beams in the image beam path (1) by a change in the tipping situation of the plate (9). A confocal microscope with such a correction device exhibits a confocal screen (4), which illustrates a specimen mark (10), whereby the plane-parallel plate (9) is placed in front of the detector unit (2) in the light path (1), in order to center the illustration of the aperture diaphragm on the detector unit.

Abstract: The invention relates to a tube lens unit that obtains a chromatically compensating effect when used with objectives having an infinite image distance and chromatic residual errors. The inventive tube lens unit fulfils the following conditions: CHL=CHLo?AT2mT?T=0??Equation (1) CHV=CHVo?1000?mT?Td1=0??Equation (2) where CHL is the longitudinal chromatic aberration of the combination of tube lens unit plus objective, CHLo is the longitudinal chromatic aberration of the objective, CHV is the chromatic difference of magnification of the combination of tube lens unit plus objective, CHVo is the chromatic difference of magnification of the objective.

Abstract: A method for depth-resolved optical detection of a specimen comprises the steps of providing a scanning movement over the specimen or at least a part of the specimen of an illumination light distribution of at least one wavelength which is generated on or in the specimen, providing detection particularly of the light which is influenced based on interaction with the specimen, especially fluorescent light and/or reflected light and/or luminescent light and/or scattered and/or transmitted light, the illumination light having a modulation in at least one spatial direction, and carrying out the scanning movement and detection associated with the scanning with the scanning movement at least in a first and a second different phase position of the modulation and/or first and second frequency of the periodicity of the modulation and calculating at least one optical section image through the specimen or through part of the specimen. Other methods and arrangements are disclosed.

Abstract: The invention is directed to a microscope objective with axially adjustable correction mounts and is applicable in connection with different cover slips and/or different immersion liquids and/or at different work temperatures. In the microscope objective according to the invention, helical springs which are uniformly distributed along the circumference and act in axial direction are fixed by a first ring which has pins in axial direction on which the helical springs are arranged. The pins engage in bore holes of a second ring. The bore holes are at least deep enough to ensure the required spring path. The two rings with the helical springs arranged therebetween on the pins form a spring retainer which ensures a movement of the parts without play and/or in a springing manner. In principle, the proposed solution can be substituted for all pressure springs in microscope objectives and other objectives and can overcome the disadvantages of using individual springs.

Abstract: A method of optical detection of characteristic quantities of an illuminated specimen comprising detecting a signal that is backscattered, reflected and/or fluoresced and/or transmitted from the specimen by a spatially resolving detector wherein radiation coming from the specimen is imaged on the detector, shifting the position of the radiation which is measured in a spatially resolved manner relative to the detector and determining intermediate values by an algorithm from the signals measured in different shifts for purposes of increasing the spatial resolution of the detector. An arrangement for performing the method is also disclosed.

Abstract: To provide an illumination beam (5) which is essentially homogeneous in cross-section, in particular for a laser scanning microscope (15), an illumination device is used which provides an original beam which is essentially rotationally symmetric in cross-section and is incident at a converting unit which then transmits the desired illumination beam (5) and which comprises, for this purpose, an aspherical, convex mirror (1) which is more strongly curved in the area of the point of incidence of the original beam (3) than in the areas removed from the point of incidence.

Abstract: Process for the observation of at least one sample region with a light raster microscope by a relative movement between the illumination light and sample via first scanning means along at least one scanning axis essentially perpendicular to the illumination axis wherein the illumination light illuminates the sample in parallel at several points or regions and several points or regions are detected simultaneously wherein at an angle to the plane of the relative movement, preferably perpendicular thereto, second scanning means are moved and an image acquisition takes place by the movement of the first and second scanning means being coupled and a three-dimensional sampling movement being done by the illumination of the sample wherein the second scanning means are coupled to the movement of the first scanning means in such a manner that straight and/or curved lines and/or plane and/or curved surfaces are scanned which are extended along at least one scanning direction of the first scanning means as well as along