Patents Assigned to Cascade Mircotech, Inc.
  • Interface for testing semiconductors
    Patent number: 7898281
    Abstract: A system includes an imaging device for capturing a video sequence and a display for displaying the video in a window of the display and effectively positioning a probe relative to probe pads of a device under test for testing a semiconductor wafer supported by a support of a probing environment.
    Type: Grant
    Filed: December 12, 2008
    Date of Patent: March 1, 2011
    Assignee: Cascade Mircotech, Inc.
    Inventors: Peter Andrews, David Hess, Robert New