Patents Assigned to Cascaded Microtech, Inc.
  • Probe for combined signals
    Patent number: 6806724
    Abstract: A direct current and a modulation signal are simultaneously applied to contact pads on a wafer to test certain devices, such as a laser diode. A probe, probing system, and method of probing reduces signal distortion and power dissipation by transmitting a modulated signal to the device-under-test through an impedance matching resistor and transmitting of a direct current to the device-under-test over a signal path that avoids the impedance matching resistor.
    Type: Grant
    Filed: November 12, 2003
    Date of Patent: October 19, 2004
    Assignee: Cascaded Microtech, Inc.
    Inventors: Leonard Hayden, Scott Rumbaugh, Mike Andrews