Abstract: This specification discloses a multigap series construction for multiple electrode monolithic capacitor structures employing ceramics. The voltage rating of such capacitors increases with each gap added across the dielectric. Additionally, the amount of piezoelectric activity occurring in a piezoelectric dielectric is limited by the series gap arrangement to be below that which causes deleterious spurious signals to be generated when said capacitor vibrates.
Abstract: This invention covers a destructive testing procedure in which a voltage 2.5 times the rated voltage is applied to the capacitor, at a relatively high current. The resistance in series with capacitors being tested is reduced step-by-step until the resistance value is reached such that the percentage of capacitor failures on any given sample of capacitors remains constant. Thereafter, all similar capacitors are tested at that resistance value and at 2.5 times the rated voltage. Those which do not explode exhibit remarkable reliability.