Patents Assigned to CephX Technologies Ltd.
  • Automated cephalometric analysis using machine learning
    Patent number: 10049457
    Abstract: A system and method are described for automating the analysis of cephalometric x-rays. Included in the analysis is a method for automatic anatomical landmark localization based on convolutional neural networks. In an aspect, the system and method employ a deep database of images and/or prior image analysis results so as to improve the outcome from the present automated landmark detection scheme.
    Type: Grant
    Filed: August 29, 2016
    Date of Patent: August 14, 2018
    Assignee: CephX Technologies Ltd.
    Inventors: Zeev Abraham, Daniel Abraham