Abstract: A system for non-contact measurement of thickness of a test object. A laser beam is split into two identical directly opposed input beams. A calibration object of known thickness causes beams to be reflected from sides of the test object. Each reflected beam passes through sensing means including a pinhole aperture and a photodiode sensor. Maximum sensor output defines first and second focal points a known distance apart. The calibration object is removed, and the test object is inserted into the path of the input beams, creating focus position intensity curves for the reflected beams. By determining the deviation, at maximum photodiode output, of the positions of the test object reflecting surfaces from the positions of the calibration object surfaces, the test object thickness can be readily and accurately determined.
Type:
Grant
Filed:
March 24, 2006
Date of Patent:
October 16, 2007
Assignee:
Chapman Instruments, Inc.
Inventors:
Thomas C. Bristow, Shu W. Wang, John E. Stephan
Abstract: A system for non-contact measurement of thickness of an object. A laser beam is split into two identical input beams that are directly opposed. A calibration object of known thickness causes beams to be reflected from sides of the test object. Each reflected beam passes through auto-focus means including a quad sensor coupled to focusing means on the input beam, causing each input beam to be focused on the calibration object, thereby defining first and second focal points a known distance apart. The focus is locked and focus error data are generated for each beam. The calibration object is removed, and the test object is inserted into the path of the focused input beams, creating focus error signals for the reflected beams. By determining the deviation of the positions of the test object reflecting surfaces from the positions of the calibration object surfaces, the test object thickness can be readily and accurately determined.
Abstract: A previewing profiler includes apparatus to scan the surface of an object and to provide a display relating to the smoothness of the surface at a microscopic level. The system includes providing a polarized collimated laser beam through a Nomarski type prism and focusing the resulting beams on the surface to be scanned. The system further includes a user operable rotatable mirror which may be inserted, upon operator command, between the laser and Nomarski prism, which mirror is designed to leak a small percentage of the laser light. Another source of noncollimated polarized light, provided through a condensing lens, is provided to the rotatable mirror to be directed along the same path through the Nomarski prism and to be focused at a point above the surface being scanned, thereby providing a substantially larger illuminated area on the surface. The reflected light from both the laser beam and additional noncollimated light is focused on a CCD array and then displayed on a display.
Type:
Grant
Filed:
August 4, 1989
Date of Patent:
May 21, 1991
Assignee:
Chapman Instruments, Inc.
Inventors:
Edward J. Merritt, Jr., Joan E. Samuels, Joseph R. Bietry