Patents Assigned to Chemimage Corp.
  • Patent number: 8112248
    Abstract: A system and method to search spectral databases and to identify unknown materials from multiple spectroscopic data in the databases. The methodology may be substantially automated and is configurable to determine weights to be accorded to spectroscopic data from different spectroscopic data generating instruments for improved identification of unknown materials. Library spectra from known materials are divided into training and validation sets. Initial, instrument-specific weighting factors are determined using a weight grid or weight scale. The training and validation spectra are weighted with the weighting factors and indicator probabilities for various sets of “coarse” weighting factors are determined through an iterative process. The finally-selected set of coarse weighting factors is further “fine tuned” using a weight grid with finer values of weights.
    Type: Grant
    Filed: January 22, 2008
    Date of Patent: February 7, 2012
    Assignee: ChemImage Corp.
    Inventors: Robert Schweitzer, Patrick J. Treado, Jason Neiss
  • Patent number: 7580126
    Abstract: The present disclosure describes methods and apparatus to produce a streaming image of a sample during a time period when an attribute of the sample is changing. The streaming image can be viewed in such a manner so as to be able to follow a visible change in an attribute of the sample. The sample may be undergoing nucleation, aggregation, or chemical interaction. The present disclosure also describes methods and apparatus to determine a change in an attribute of a sample by detecting, analyzing, and comparing spectra of the sample taken at different times during the time period when the attribute of the sample is changing. The sample may be undergoing nucleation, aggregation, or chemical interaction.
    Type: Grant
    Filed: November 8, 2005
    Date of Patent: August 25, 2009
    Assignee: ChemImage Corp.
    Inventor: David Tuschel
  • Patent number: 7286231
    Abstract: In one embodiment the disclosure relates to a method and a system for determining the corrected wavelength of a photon scattered by a sample. The method includes the steps of determining a wavelength of a photon scattered from a sample exposed to illuminating photons and passed through a tunable filter and correcting the determined wavelength of the photon as a function of the temperature of the tunable filter and as a function of the bandpass set point of the tunable filter. The step of correcting the determined wavelength can further include determining an offset and adding the offset to the determined wavelength of the photon.
    Type: Grant
    Filed: June 30, 2004
    Date of Patent: October 23, 2007
    Assignee: ChemImage Corp.
    Inventors: John S. Maier, Jason H. Neiss, Shona Stewart
  • Patent number: 7283241
    Abstract: The disclosure generally relates to a multimode imaging apparatus for simultaneously obtaining multiple wavelength-discriminative spectral images of a sample.
    Type: Grant
    Filed: January 31, 2005
    Date of Patent: October 16, 2007
    Assignee: Chemimage Corp.
    Inventors: Xinghua Wang, Thomas C. Voigt, David Tuschel, Chenhui Wang, Patrick J. Treado
  • Publication number: 20060192956
    Abstract: A chemical imaging system is provided which uses a near infrared radiation microscope. The system includes an illumination source which illuminates an area of a sample using light in the near infrared radiation wavelength and light in the visible wavelength. A multitude of spatially resolved spectra of transmitted, reflected, emitted or scattered near infrared wavelength radiation light from the illuminated area of the sample is collected and a collimated beam is produced therefrom. A near infrared imaging spectrometer is provided for selecting a near infrared radiation image of the collimated beam. The filtered images are collected by a detector for further processing. The visible wavelength light from the illuminated area of the sample is simultaneously detected providing for the simultaneous visible and near infrared chemical imaging analysis of the sample. Two efficient means for performing three dimensional near infrared chemical imaging microscopy are provided.
    Type: Application
    Filed: October 24, 2005
    Publication date: August 31, 2006
    Applicant: ChemImage Corp
    Inventors: Patrick Treado, Matthew Nelson, Scott Keitzer
  • Publication number: 20060091311
    Abstract: A chemical imaging system is provided which uses a near infrared radiation microscope. The system includes an illumination source which illuminates an area of a sample using light in the near infrared radiation wavelength and light in the visible wavelength. A multitude of spatially resolved spectra of transmitted, reflected, emitted or scattered near infrared wavelength radiation light from the illuminated area of the sample is collected and a collimated beam is produced therefrom. A near infrared imaging spectrometer is provided for selecting a near infrared radiation image of the collimated beam. The filtered images are collected by a detector for further processing. The visible wavelength light from the illuminated area of the sample is simultaneously detected providing for the simultaneous visible and near infrared chemical imaging analysis of the sample. Two efficient means for performing three dimensional near infrared chemical imaging microscopy are provided.
    Type: Application
    Filed: October 24, 2005
    Publication date: May 4, 2006
    Applicant: ChemImage Corp
    Inventors: Patrick Treado, Matthew Nelson, Scott Keitzer
  • Publication number: 20060049354
    Abstract: A chemical imaging system is provided which uses a near infrared radiation microscope. The system includes an illumination source which illuminates an area of a sample using light in the near infrared radiation wavelength and light in the visible wavelength. A multitude of spatially resolved spectra of transmitted, reflected, emitted or scattered near infrared wavelength radiation light from the illuminated area of the sample is collected and a collimated beam is produced therefrom. A near infrared imaging spectrometer is provided for selecting a near infrared radiation image of the collimated beam. The filtered images are collected by a detector for further processing. The visible wavelength light from the illuminated area of the sample is simultaneously detected providing for the simultaneous visible and near infrared chemical imaging analysis of the sample. Two efficient means for performing three dimensional near infrared chemical imaging microscopy are provided.
    Type: Application
    Filed: October 24, 2005
    Publication date: March 9, 2006
    Applicant: ChemImage Corp
    Inventors: Patrick Treado, Matthew Nelson, Scott Keitzer
  • Publication number: 20060033026
    Abstract: A chemical imaging system is provided which uses a near infrared radiation microscope. The system includes an illumination source which illuminates an area of a sample using light in the near infrared radiation wavelength and light in the visible wavelength. A multitude of spatially resolved spectra of transmitted, reflected, emitted or scattered near infrared wavelength radiation light from the illuminated area of the sample is collected and a collimated beam is produced therefrom. A near infrared imaging spectrometer is provided for selecting a near infrared radiation image of the collimated beam. The filtered images are collected by a detector for further processing. The visible wavelength light from the illuminated area of the sample is simultaneously detected providing for the simultaneous visible and near infrared chemical imaging analysis of the sample. Two efficient means for performing three dimensional near infrared chemical imaging microscopy are provided.
    Type: Application
    Filed: October 24, 2005
    Publication date: February 16, 2006
    Applicant: ChemImage Corp.
    Inventors: Patrick Treado, Matthew Nelson, Scott Keitzer