Abstract: A chip package with asymmetric molding including a lead frame, a chip, an adhesive layer, bonding wires and an encapsulant, is provided. The lead frame includes a frame body and at least a turbulent plate. The frame body has inner lead portions and outer lead portions. The turbulent plate is bended upwards to form a bulge portion and the first end of the turbulent plate is connected to the frame body. The chip is fixed under the inner lead portions and the turbulent plate is located at one side of the chip. The adhesive layer is disposed between the chip and the inner lead portions, and the bonding wires are electrically connected between the chip and the corresponding inner lead portions, respectively. The encapsulant encapsulates at least the chip, the bonding wires, the inner lead portions, the adhesive layer and the turbulent plate.
Abstract: A chip package including a base, a chip, a molding compound and a plurality of outer terminals is provided. The base is essentially consisted of a patterned circuit layer having a first surface and a second surface opposite to each other and a solder mask disposed on the second surface, wherein the solder mask has a plurality of first openings by which part of the patterned circuit layer is exposed. The chip is disposed on the first surface and is electrically connected to the patterned circuit layer. The molding compound covers the pattern circuit layer and fixes the chip onto the patterned circuit layer. The outer terminals are disposed in the first openings and electrically connected to the patterned circuit layer.
Abstract: A chip structure including a chip, a first passivation layer, a redistribution layer and a second passivation layer is provided. The chip has a wire bonding area adjacent to one side or two sides adjacent to each other of the chip, wherein the chip has multiple first bonding pads disposed inside the wire bonding area and multiple second pads disposed outside the wire bonding area. The first passivation layer disposed on the chip has multiple first openings by which the first and the second bonding pads are exposed. The redistribution layer is disposed on the first passivation layer and extended from the second bonding pads to the wire bonding area. The redistribution layer has multiple third bonding pads located inside the wire bonding area. The second passivation layer disposed over the redistribution layer has multiple second openings by which the first and the third bonding pads are exposed.