Abstract: A method of Atomic Force Microscopy (AFM). A first drive signal is generated for causing a periodic motion of a probe tip in a direction normal to a sample surface. The first drive signal has a known amplitude and frequency. A bias signal is generated for applying an electric potential to the probe tip relative to a potential the sample surface. At least one component of the bias signal is oscillatory and correlated with the periodic motion of the probe tip. A response of the probe tip is detected, and analyzed by a processor to infer information about a composition of the sample surface.

Abstract: Methods and systems are provided to reduce the complexity of sequential digital circuitry including cells of unknown function by grouping and defining like instance of combinational circuitry cells. The system groups together cells that feed into the same combination of one or more state cells. The groups of cells are then replaced by clouds which are defined in the netlist for the sequential digital circuitry to produce a simpler representation of the circuitry for analysis purposes and to aid in determining the function of those cells for which the function is unknown.

Abstract: A system is disclosed for displaying circuitry interconnections as flightlines between a component specified as the local component and the foreign components connecting to the local component. Upon obtaining data of the circuit components and interconnections, a user can designate the local component from among all of the circuit components. The system determines the foreign components connected to that local component, retrieves the flightline appearance display settings for the computer display, and renders a view of the specified local component and its foreign components with flightlines representing each interconnection connection. The flightlines can be color coded to indicate inputs, outputs or other characteristics of interest to the user.