Patents Assigned to CHOTEST TECHNOLOGY INC.
  • Publication number: 20240159528
    Abstract: Some embodiments of the disclosure provide a method for measuring orthogonality of an orthogonal axis system, In some examples, the method includes following steps: placing an instrument on a bearing surface, intercepting a second rotary axis along an interception plane to obtain a first virtual cross section of the second rotary axis, and measuring the first virtual cross section to obtain a geometric center of the first virtual cross section as a first position; rotating a first rotary device to enable the second rotary axis to rotate with a preset angular degree, and measuring the second virtual cross section to obtain a geometric center of the second virtual cross section as a second position; and determining whether the orthogonality between the first rotary axis and the second rotary axis meets requirements or not on the basis of the first position and the second position.
    Type: Application
    Filed: December 22, 2021
    Publication date: May 16, 2024
    Applicant: CHOTEST TECHNOLOGY INC.
    Inventors: Zhiwei Zhang, Yuan Chen, Hejun Zhang, Furong Feng, Xuewen Liao, Longjun Cheng