Abstract: A method and apparatus for testing micro SD devices each having a plurality of electrical leads is described. The method and apparatus utilizes industry standard JEDEC trays and tests all devices in such trays at the same time.
Type:
Grant
Filed:
April 12, 2007
Date of Patent:
February 10, 2009
Assignee:
Chruma Ate Inc.
Inventors:
James E. Hopkins, Michael Peter Costello, Herbert Tsai, Ching-Too Chen