Abstract: A flexible probe, applicable for measuring signals from the object with an uneven surface, includes at least a probe tip, a flexible multi-layered dielectric substrate, a planar transmission structure and a coaxial transmission structure. The probe tip is connected to the planar transmission structure and extends beyond the flexible dielectric substrate. The planar transmission structure is attached to and supported by the flexible dielectric substrate and then connected to the coaxial transmission structure.
Type:
Grant
Filed:
April 5, 2004
Date of Patent:
August 16, 2005
Assignee:
Chung Shan Institute of Science and Technology Armaments Bureau, M.N.D.
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