Patents Assigned to CIC Photonics, Inc.
  • Publication number: 20120203510
    Abstract: Collecting and analyzing spectral data can be challenging when multiple analysis instruments need to be integrated and monitored by a quality control agent within a laboratory, industrial plant, field operation, or even an aerospace environment. The spectral analysis system and method, as presented, provides improved quality control, process control, and data management through unique feedback mechanisms between all hardware and software components within an analytical environment. Through spectral analysis presented, meaningful information is extracted from a spectral signal and fed back into the spectral analysis system to enhance overall system performance. A centralized database is provided to allow multiple users the opportunity to query the database for historical spectral records that can lead to the generation of meaningful reports.
    Type: Application
    Filed: February 9, 2011
    Publication date: August 9, 2012
    Applicant: CIC Photonics, Inc.
    Inventors: Jorge E. Perez, Richard T. Meyer
  • Patent number: 5859434
    Abstract: A system for delivering infrared energy to a sample using frustrated internal reflectance in which a crystal for receiving the infrared energy is formed integrally with a removable mounting card. The mounting card is removable so that new samples can be sampled by quickly replacing the crystal with a new crystal having a new sample for analysis. Preferably, the crystal has the shape of a Fresnel lens. The infrared energy can be delivered to the crystal so that it experiences a single internal reflection and mounted in a card to form a surface that is integral with one side of the card to facilitate rapid cleaning and reuse of the card.
    Type: Grant
    Filed: July 21, 1997
    Date of Patent: January 12, 1999
    Assignee: CIC Photonics, Inc.
    Inventor: Robert G. Messerschmidt