Patents Assigned to Circuit Image Systems
  • Patent number: 6445969
    Abstract: A method and system for monitoring process parameters associated with a manufacturing or testing process. The system includes: at least one machine which is used in the manufacturing or testing process; at least one sensing device, coupled to the at least one machine, for measuring a process parameter associated with the at least one machine; and a controller, coupled to the at least one sensing device, for receiving and storing measured data from the at least one sensing device. The method includes the acts of: measuring a value of a process parameter associated with a machine used in the manufacturing or testing process; converting the measured value of the process parameter into a digital data signal having a specified data format; transmitting the digital data signal to a controller; and storing the digital data signal in a database.
    Type: Grant
    Filed: January 9, 1998
    Date of Patent: September 3, 2002
    Assignee: Circuit Image Systems
    Inventors: Jim Kenney, John Leon