Abstract: Systems and methods for calculating time-of-flight (TOF) are provided. In some embodiments, a TOF system may launch the one or more charged particles from the first location to the detector at the second location along a path using the pusher assembly. The system may determine a TOF for each of the one or more charged particles. The TOF system may include a high-voltage pulse generator, a pulse detector, a TDC, a detection comparator, a start latch, a stop latch, and a control system. The high-voltage pulse generator may output a high voltage pulse to cause the pusher assembly to launch the one or more charged particles. The pulse detector may detect the high voltage pulse and output a start signal. The TDC may determine the TOF for each of the one or more charged particles based on a stopwatch.

Abstract: Systems and methods for calculating time-of-flight (TOF) are provided. In some embodiments, a TOF system may launch the one or more charged particles from the first location to the detector at the second location along a path using the pusher assembly. The system may determine a TOF for each of the one or more charged particles. The TOF system may include a high-voltage pulse generator, a pulse detector, a TDC, a detection comparator, a start latch, a stop latch, and a control system. The high-voltage pulse generator may output a high voltage pulse to cause the pusher assembly to launch the one or more charged particles. The pulse detector may detect the high voltage pulse and output a start signal. The TDC may determine the TOF for each of the one or more charged particles based on a stopwatch.

Abstract: Systems and methods for analyzing samples are provided. In some embodiments, a mass spectrometer may include a source configured to output one or more ions, a plurality of chambers having different pressures, a detector configured to detect the one or more ions, and a particle guide. The plurality of chambers may include at least a first chamber having a first pressure that is less than atmospheric pressure and a second chamber having a second pressure that is less than the first pressure. In some embodiments, the particle guide may include a conduit through which the one or more ions may travel an entire length of the particle guide. The conduit may be disposed within at least the first chamber and the second chamber, and vents may be disposed to define passages between the chambers and the conduit.

Abstract: Systems and methods for analyzing samples are provided. In some embodiments, a mass spectrometer may include a source configured to output a plurality of particles, a tube having a central axis, and a skimmer. In some embodiments, the skimmer may include an aperture arranged to receive the one or more charged particles deflected by a deflector and a contact surface comprising an intersection point that intersects the central axis of the tube. The intersection point may be spaced from the aperture by a distance of at least 5 mm.