Abstract: Disclosed is a telephone system test apparatus for a telephone switching system having tip and ring circuits which cause a control relay to close upon completion of a path therebetween and which cause the same relay to close upon further opening and closures of the path between the tip and ring circuits. Means monitors such a telephone system for detecting a preselected operative condition therein. Means detects a predetermined impedance condition across such tip and ring circuits. A dial pulse loop circuit is coupled across such tip and ring circuits and it normally has a high impedance condition. Means selectively switches a first low impedance condition around the dial pulse loop circuit upon detection of such predetermined impedance condition and thereby applies a margin test to the first relay. Means opens and closes the dial pulse loop circuit one or more times for applying dial pulses across the tip and ring circuits upon detection of the proper operating conditions and the non busy condition.

Abstract: A test apparatus for forward selector switches in a telephone switching system having a telephone loop. Means detects a preselected operative condition in such telephone systems. Means generates a variable number of pulses for control of forward selector switches. The latter includes the following: A switch for closing and breaking a telephone loop to thereby form such a pulse; an indicator for indicating the desired number of pulses including one or more than one pulse; a counter; means for enabling the counter to count the formed pulses greater than one; a control circuit enables the switch to break a telephone loop upon such detection of a predetermined operative condition and for each different state of the counter, and the control circuit is also operative for terminating the breaking by the switch upon a predetermined relation existing between the indicator and counter. Also disclosed is a pulse generating means as a subcombination of the aforementioned.