Abstract: An apparatus which inserts electronic memory modules into test equipment via direct horizontal insertion eliminating the need for intermediary connectors or adapters. The apparatus incorporates guide rails that maintain precise alignment of the electronic memory modules through the testing apparatus, sensors and microprocessor controlled belt apparatus to clear the automated transport paths of electronic memory module handler apparatus and automatically stacks the tested electronic memory modules.

Abstract: A method of testing memory of a system is disclosed which operates the system from a second area of system address space which is outside of a first area of system address space, the system having one or more physical memory devices associated with the first area of system address space. The memory locations associated with the first area of the system address space are tested for predetermined characteristics after which the one or more tested physical memory devices are replaced with respective untested physical memory devices without dropping power to the system, and tested by repeating the test cycle. The system is prevented from operating in the first area of system address space and forced to operate from the second area, thereby preventing system interruptions when replacing the physical memory devices for testing.

Abstract: An apparatus is disclosed for automatically testing electronic memory modules. The electronic memory modules are automatically positioned, one at a time, in a test station position for registration with test contacts of a test connector assembly. The test connector assembly includes a mounting fixture which secures the test contacts, such that first ends of the test contacts are appropriately aligned for registering with surface contacts of the electronic memory modules. Second, opposite ends of the test contacts are mounted to a transition board. The transition board has first and second opposite edges, with the first edge having surface contacts which are closely spaced for registering with the test contacts, and the second edge having surface contacts which are more widely spaced than those on the first edge for registering with connector contacts of a tester module. Conductive traces extend between the surface contacts of the first and second edges of the transition board.

Abstract: A connector alignment assembly is provided for aligning memory modules in a test position relative to a memory module tester. An automatic feeder receives, stages and then dispenses the electronic memory modules onto a conveyor, one at a time. The conveyor moves the electronic memory modules from the feeder to a test station. A contact plunger is used to push tester contacts against surface contacts of the electronic memory module to electrically connect the electronic memory module to test circuitry. The connector alignment assembly includes two alignment pins which are mounted to the contact plunger, such that when the contact plunger is moved to press the test contacts against the surface contacts, the alignment pins are moved into two alignment holes of the electronic memory module.