Patents Assigned to Comstock, Inc.
  • Patent number: 5969350
    Abstract: A matrix-assisted laser desorption ionization/laser desorption ionization (MALDI/LDI) time-of-flight mass spectrometer (TOF-MS) which includes an ion source employing a ground voltage configuration. The improved MALDI/LDI TOF-MS includes a laser for ablating a sample positioned within a gridless source. The ionized sample is then repelled through a floating flight tube toward a detector and within a vacuum chamber. The floating flight tube allows a lower than conventional voltage to be applied to the ions. A digital camera is provided for viewing a sample when positioned in the vacuum ready for analysis. The sample image is displayed on the control computer monitor and is available for computer analysis and instrumentation control, including external instrumentation such as that involved in sample preparation and handling.
    Type: Grant
    Filed: March 17, 1998
    Date of Patent: October 19, 1999
    Assignee: Comstock, Inc.
    Inventors: Eric L. Kerley, Robert E. Haufler, John A. D. Stockdale
  • Patent number: 5955730
    Abstract: An improved reflectron time-of-flight mass spectrometer having improved design features in both the ion source and the ion reflection region. The ion source employs a near-ground voltage configuration and second-order spatial focusing of generated ions. The ion mirror is a new two-stage, second-order-corrected, energy-focusing, gridless design. The near-ground voltage configuration of the source, the second-order spatial focusing design of the source, and the new ion mirror serve to yield superior mass resolution, superior sensitivity, and superior safety, utility, and operational characteristics.
    Type: Grant
    Filed: June 26, 1997
    Date of Patent: September 21, 1999
    Assignee: Comstock, Inc.
    Inventors: Eric L. Kerley, Robert E. Haufler
  • Patent number: 5825025
    Abstract: A miniaturized time-of-flight mass spectrometer having a minimized flight path of sample ions between a repeller and a detector in order to minimize the overall size of the time-of-flight mass spectrometer (TOF-MS), thereby requiring a reduced vacuum capacity. The TOF-MS includes an ionizer in which a sample to be tested is placed. An electron gun is provided for emitting electrons through the ionizer to the sample, thus ionizing the sample. An input lens comprising a plurality of electrodes is provided for collimating the ions freed from the sample and directing the collimated ions toward an accelerator region. To reduce lateral velocity spread in the incoming ion beam, the input lens is set to have its input focal point at the point of ionization. A mass spectrometer is provided for detection of the freed ions. A repeller is pulsed to push the ions toward a detector in the TOF-MS. The ions travel through a plurality of grids provided to maintain a linear electric field and into the flight tube.
    Type: Grant
    Filed: November 8, 1996
    Date of Patent: October 20, 1998
    Assignee: Comstock, Inc.
    Inventor: Eric L. Kerley