Abstract: An apparatus for testing an integrated circuit includes a sequence control logic unit having an output channel connectable to an input pin of a device under test, a first memory to store a first instruction set comprising instructions executable by the sequence control logic unit, and a second memory to store a second instruction set comprising instructions executable by the sequence control logic unit, wherein at least one of the first memory and the second memory comprises a memory accessible in a non-sequential fashion.
Abstract: In one aspect, the invention is a method for processing pulse oxymetry data signals. The method includes recording pulse oxymetry data signals. The pulse oxymetry data signals have a plurality of oxymetry waveforms. The method also includes determining a correlation coefficient between sequential oxymetry waveforms and identifying a valid pulse oxymetry waveform.