Patents Assigned to Conductor Analysis Technologies, Inc.
  • Patent number: 7287903
    Abstract: An apparatus for rapid thermal testing of samples consisting of a single sample chamber in which the samples are preferably arranged circularly around the opening through which a fluid of varying temperature, preferably air, is introduced to provide for rapid, uniform cooling and heating of the samples. The samples are preferably uniformly spaced to allow for uniform air flow. The samples are mounted in slots which are preferably oriented radially outward from the opening. The sample mounts comprise electrical connectors which form a network connected to at least one ohmmeter for measuring the resistance of the samples. The samples preferably comprise test coupons, each with multiple daisy-chained nets of vias or other components to be tested. Also a method for thermal testing of samples consisting of steps to characterize the samples before the test is run.
    Type: Grant
    Filed: February 20, 2004
    Date of Patent: October 30, 2007
    Assignee: Conductor Analysis Technologies, Inc.
    Inventors: Timothy A. Estes, Robert Neves
  • Publication number: 20040233966
    Abstract: An apparatus for rapid thermal testing of samples consisting of a single sample chamber in which the samples are preferably arranged circularly around the opening through which a fluid of varying temperature, preferably air, is introduced to provide for rapid, uniform cooling and heating of the samples. The samples are preferably uniformly spaced to allow for uniform air flow. The samples are mounted in slots which are preferably oriented radially outward from the opening. The sample mounts comprise electrical connectors which form a network connected to at least one ohmmeter for measuring the resistance of the samples. The samples preferably comprise test coupons, each with multiple daisy-chained nets of vias or other components to be tested. Also a method for thermal testing of samples consisting of steps to characterize the samples before the test is run.
    Type: Application
    Filed: February 20, 2004
    Publication date: November 25, 2004
    Applicant: Conductor Analysis Technologies, Inc.
    Inventors: Timothy A. Estes, Robert Neves