Patents Assigned to CONSEJO SUPERIOR DE INVESTICACIONES CIENTÍFICAS (CSIC)
  • MODIFICATION OF ATOMIC FORCE MICROSCOPY TIPS BY DEPOSITION OF NANOPARTICLES WITH AN AGGREGATE SOURCE
    Publication number: 20130111637
    Abstract: The present invention relates to a method for covering Atomic Force Microscopy (AFM) tips by depositing a material in the form of nanoparticles with an aggregate source.
    Type: Application
    Filed: May 4, 2011
    Publication date: May 2, 2013
    Applicant: CONSEJO SUPERIOR DE INVESTICACIONES CIENTÍFICAS (CSIC)
    Inventors: Elisa Leonor Roman Garcia, Lidia Martinez Orellana, Mercedes Diaz Lagos, Yves Huttel