Abstract: Compound surfaces of a test object are interferometrically measured by a multi-beam probe. One of two measuring beams emerges from the probe at a fixed angle for measuring one of the compound surfaces, and the other measuring beam emerges from the probe at a variable angle for measuring a plurality of other compound surfaces.
Abstract: A scanning interferometer employs dual interferometer modules at different wavelengths to expand a dynamic range of measurement, a compound probe for measuring multiple surfaces, and a confocal optical system for distinguishing between the surfaces measured by the compound probe. Within the compound probe, miniature optics divide a test beam into two sub-test beams that are focused normal to different test surfaces. Both sub-test beams contain the different wavelengths. A separate interferometer monitors movements of the compound probe for producing absolute measures of the test surfaces.
Type:
Grant
Filed:
October 22, 2002
Date of Patent:
August 24, 2004
Assignee:
Corning-Tropel
Inventors:
Thomas J. Dunn, Andrew W. Kulawiec, Mark J. Tronolone