Abstract: An integrated X-ray and visual inspection system having an inspection subsystem with a holder holding an object to be inspected, an X-ray source, a camera receiving an X-ray image of an object to be inspected and a camera receiving a visible image of an object to be inspected, the X-ray source and camera receiving the X-ray image being positioned on opposite sides of the holder. A display may also be provided for displaying the images. The system is well suited to the inspection of printed circuit boards having electronic components mounted thereon, in which case the holder may be a conveyor for the printed circuit boards. Independent positioning of the X-ray source and camera receiving the X-ray image allows offset images of the printed circuit board topside and bottomside features of the board. Various other features of the system and methods are disclosed.