Abstract: A connector assembly for a wriststrap jack is provided wherein the jack may be easily replaced in accordance with the invention.

Abstract: The invention is a grounding device that grounds the wearer when the wearer is in a designated area and automatically disengages when the wearer leaves the designated area. In more detail, the grounding device includes a wristband that is electrically coupled to a grounded object with a fastening mechanism, wherein the fastening mechanism automatically releases to separate the wristband from the grounded object if the wristband is outside of the designated area. Where the fastening mechanism includes a coupling mechanism (e.g., a wire), there may be a rotating device that retracts the coupling mechanism after the fastening mechanism is released. The device may be enhanced with a grounding device monitoring unit that monitors whether the grounding device is in use and a sensor that detects whether the operator is in the designated area, so that an alarm is triggered if the operator is in the designated area and the grounding device is not in use.

Abstract: A device and method for ionization control is provided. The device and method controls the ionization balance using a sensor element, a control circuit that produces output signal as a function of an input signal from the sensor and transmits that output signal to the ionizer being controlled. The device also has a mechanism for detecting rapid changes in the input signal and a mechanism for disabling changes in the control signal for the duration of presence of said rapidly-changing signal.

Abstract: A system and method for measuring process parameters in a process machine is described. The system is synchronized to the operation of the process machine so that spurious process parameters events are filtered out.

Abstract: A device and method for ionization control is provided. The device and method controls the ionization balance using a sensor element, a control circuit that produces output signal as a function of an input signal from the sensor and transmits that output signal to the ionizer being controlled. The device also has a mechanism for detecting rapid changes in the input signal and a mechanism for disabling changes in the control signal for the duration of presence of said rapidly-changing signal.

Abstract: A method and apparatus for monitoring grounding of personnel and equipment in electrostatic discharge (ESD) sensitive areas. The device generates a low voltage alternating current control signal (60) which is applied to personnel (50) and equipment (350) being monitored. The device further includes signal conditioning (66) and detection means (70) to distinguish static charges from the control signal and transmit an alarm (72) upon detection of such static charge. The method encompasses the use of an alternating current control signal to detect static charge.

Abstract: A device and method for ionization control is provided. The device and method controls the ionization balance using a sensor element, a control circuit that produces output signal as a function of an input signal from the sensor and transmits that output signal to the ionizer being controlled. The device also has a mechanism for detecting rapid changes in the input signal and a mechanism for disabling changes in the control signal for the duration of presence of said rapidly-changing signal.

Abstract: An ESD and transient signal monitoring system and method are provided wherein an ESD monitoring device may be used to continuously monitor ESD events and generate an indicating of the magnitude of the ESD events. A method for protecting an electronic device from ESD events is also described.

Abstract: The present invention provides a device for in-situ measurement and recording of various environmental parameters in a semiconductor fabrication process. The device comprises sensors for detecting the parameters and converting them to sensor outputs; and a data logger coupled to the sensors for receiving the sensor outputs and logging them in a file. The device may also comprise an analog to digital converter to convert the sensor outputs to digital data and a communication module to communicate the digital data with other devices. When applied to reticles used in a semiconductor fabrication process comprising a plurality of stages, the device may be used to monitor electrostatic field and electrostatic discharge activities on and around the reticle, convert the monitored parameters into data, and log the data along with a timestamp and an identification of each individual stage.

Abstract: The present invention provides a device for in-situ measurement and recording of various environmental parameters in a semiconductor fabrication process. The device includes sensors for detecting the parameters and converting them to sensor outputs and a data logger coupled to the sensors for receiving the sensor outputs and logging them in a file. The device may also include an analog to digital converter to convert the sensor outputs to digital data and a communication module to communicate the digital data with other devices. When applied to reticles used in a semiconductor fabrication process comprising a plurality of stages, the device may be used to monitor electrostatic field and electrostatic discharge activities on and around the reticle, convert the monitored parameters into data, and log the data along with a timestamp and an identification of each individual stage.

Abstract: The present invention provides a device for in-situ measurement and recording of various environmental parameters in a semiconductor fabrication process. The device includes sensors for detecting the parameters and converting them to sensor outputs, a data logger coupled to the sensors for receiving the sensor outputs and logging them in a file. The device also includes an analog to digital converter to convert the sensor outputs to digital data and a communication module to communicate the digital data with other devices. When applied to reticles used in a semiconductor fabrication process comprising a plurality of stages, the device may be used to monitor electrostatic field and electrostatic discharge activities on and around the reticle, convert the monitored parameters into data, and log the data along with a timestamp and an identification of each individual stage.

Abstract: An ESD and transient signal monitoring system and method are provided wherein an ESD monitoring device may be used to continuously monitor ESD events and generate an indicating of the magnitude of the ESD events. A method for protecting an electronic device from ESD events is also described.

Abstract: The present invention provides a device for in-situ measurement and recording of various environmental parameters in a semiconductor fabrication process. The device comprises sensors for detecting the parameters and converting them to sensor outputs; and a data logger coupled to the sensors for receiving the sensor outputs and logging them in a file. The device may also comprise an analog to digital converter to convert the sensor outputs to digital data and a communication module to communicate the digital data with other devices. When applied to reticles used in a semiconductor fabrication process comprising a plurality of stages, the device may be used to monitor electrostatic field and electrostatic discharge activities on and around the reticle, convert the monitored parameters into data, and log the data along with a timestamp and an identification of each individual stage.

Abstract: The present invention provides a device for in-situ measurement and recording of various environmental parameters in a semiconductor fabrication process. The device comprises sensors for detecting the parameters and converting them to sensor outputs; and a data logger coupled to the sensors for receiving the sensor outputs and logging them in a file. The device may also comprise an analog to digital converter to convert the sensor outputs to digital data and a communication module to communicate the digital data with other devices. When applied to reticles used in a semiconductor fabrication process comprising a plurality of stages, the device may be used to monitor electrostatic field and electrostatic discharge activities on and around the reticle, convert the monitored parameters into data, and log the data along with a timestamp and an identification of each individual stage.

Abstract: An apparatus for detecting, locating and measuring electromagnetic radiation is provided. The apparatus may be a self-contained, portable device which permits a user to detect, locate and measure electromagnetic radiation from distance away from the radiation source in presence of interference.

Abstract: A system for protecting an electronic device from electromagnetic radiation is provided that receives electromagnetic radiation impinging on said electronic device, determines a value of a characteristic of said electromagnetic radiation, generates a testing signal when said value of said characteristics of said electromagnetic radiation is greater than a predetermined value, and tests said electronic device in response to said testing signal to determine if said electromagnetic radiation has affected said electronic device. A method for protecting an electronic device from electromagnetic radiation is also provided.

Abstract: Apparatus for detection of the electro-magnetic field and measurement of its strength in the near field. The apparatus includes an antenna suited to receive specified type of the electro-magnetic field; a detector to convert received signal into DC voltage, a summing device and a potentiometer to set the reference level, a DC amplifier for amplification of resulting signal. The apparatus further includes a voltage-controlled oscillator and a speaker that produces an audible tone with the pitch proportional to the field strength. The apparatus further includes a squelch circuit that blocks the sound when the field strength gets lower than the preset range. The apparatus further includes LED level bar as visual means of indicating field strength. The apparatus is constructed as a fully self-contained unit needing no additional equipment for its operation.