Patents Assigned to Cross-Check Systems, Inc.
  • Patent number: 4749947
    Abstract: A new test structure is described which allows full testing of highly complex Integrated Circuits. The test structure consists of a grid of externally as well as individually accessible probe-lines and sense-lines with electronic switches at the crossings of said probe and the sense-lines. One end of the switches is tied to an array of test-points on the IC that are to be either monitored or controlled during the testing, and the other end of the switches is tied to a sense-line. The ON and the OFF states of the switches are controlled by probe-lines. The probe and sense lines are connected to test electronics, thus permitting the test electronics to control the electrical signals on the probe-lines and to measure or apply signals on the sense-lines. Thus, by the excitation of an appropriate probe-line and the monitoring of an appropriate sense-line, the test signals present at any one of the test-points can be measured.
    Type: Grant
    Filed: March 10, 1986
    Date of Patent: June 7, 1988
    Assignee: Cross-Check Systems, Inc.
    Inventor: Tushar R. Gheewala