Patents Assigned to CSM Instruments SA
  • Patent number: 8261600
    Abstract: A method for analyzing a scratch from a scratch test includes (a) locating the beginning of the scratch relative to a reference position, (b) making the scratch on a bulk with an indenter while recording the applied force and at least one measurement parameter, as a function of the displacement of the indenter relative to the reference position, (c) acquiring and recording images of the scratch relative to the reference position, (d) synchronizing the recorded images, the applied force and the measurement parameter, as a function of the displacement of the indenter, (e) displaying curves of the applied force and of the measurement parameter as a function of the displacement of the indenter, and (f) displaying in a synchronized way an image of the scratch reconstructed from the recorded images.
    Type: Grant
    Filed: November 26, 2008
    Date of Patent: September 11, 2012
    Assignee: CSM Instruments SA
    Inventors: Pierre-Jean Coudert, Bertrand Bellaton
  • Patent number: 7685868
    Abstract: A measuring head for a nano-indentation instrument capable of positioning a sample relatively to the measuring head, which includes a measuring axis, a reference axis and a component for detecting a depth of penetration of an indentor into the sample. The measuring and reference axes are attached to a frame for connection to the instrument. The measuring axis incorporates an actuator and includes the indentor, the reference axis incorporates an actuator and includes a reference tip, and the measuring and reference axes each have a component for detecting a force applied by its actuator. Penetration depth is detected by measuring a displacement of the indentor relatively to the reference tip.
    Type: Grant
    Filed: November 16, 2005
    Date of Patent: March 30, 2010
    Assignee: CSM Instruments SA
    Inventors: Jacques Woirgard, Bertand Bellaton, Richard Consiglio