Patents Assigned to CTP, Inc.
  • Patent number: 6554953
    Abstract: A plasma reactor and methods for processing semiconductor substrates are described. An induction coil inductively couples power into the reactor to produce a plasma. A thin electrostatic shield is interposed between the induction coil and plasma to reduce capacitive coupling. The shield is electromagnetically thin such that inductive power passes through the shield to sustain the plasma while capacitive coupling is substantially attenuated. Reducing capacitive coupling reduces modulation of the plasma potential relative to the substrate and allows for more controllable processing.
    Type: Grant
    Filed: September 13, 2001
    Date of Patent: April 29, 2003
    Assignee: CTP, Inc.
    Inventor: Jean-François Daviet
  • Patent number: 6312555
    Abstract: A plasma reactor and methods for processing semiconductor substrates are described. An induction coil inductively couples power into the reactor to produce a plasma. A thin electrostatic shield is interposed between the induction coil and plasma to reduce capacitive coupling. The shield is electromagnetically thin such that inductive power passes through the shield to sustain the plasma while capacitive coupling is substantially attenuated. Reducing capacitive coupling reduces modulation of the plasma potential relative to the substrate and allows for more controllable processing.
    Type: Grant
    Filed: March 20, 2000
    Date of Patent: November 6, 2001
    Assignee: CTP, Inc.
    Inventor: Jean-François Daviet
  • Patent number: 6056848
    Abstract: A plasma reactor and methods for processing semiconductor substrates are described. An induction coil inductively couples power into the reactor to produce a plasma. A thin electrostatic shield is interposed between the induction coil and plasma to reduce capacitive coupling. The shield is electromagnetically thin such that inductive power passes through the shield to sustain the plasma while capacitive coupling is substantially attenuated. Reducing capacitive coupling reduces modulation of the plasma potential relative to the substrate and allows for more controllable processing.
    Type: Grant
    Filed: September 10, 1997
    Date of Patent: May 2, 2000
    Assignee: CTP, Inc.
    Inventor: Jean-Fran.cedilla.ois Daviet