Patents Assigned to CUBIXEL CO., LTD.
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Patent number: 12147193Abstract: The present invention relates to an inline scanning holography system for a phosphor and a transmitter. According to the present invention, the inline scanning holography system includes a polarization sensitive lens that receives a linearly polarized beam and generates a first spherical wave of right-handed circular polarized light having a negative focal length and a second spherical wave of left-handed circular polarized light having a positive focal length, a polarizer that passes only a beam component in a predetermined polarization direction therethrough among components of the generated first and second spherical waves, a scanning unit for scanning a phosphor by using an interference beam generated between the first and second spherical waves passing through the polarizer, and a first photodetector that detects a fluorescent beam diverged from the phosphor.Type: GrantFiled: September 11, 2020Date of Patent: November 19, 2024Assignee: Cubixel Co., Ltd.Inventor: Tae Geun Kim
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Patent number: 12050435Abstract: An optical scanning holography system includes a polarization-sensitive lens configured to receive a linearly polarized beam and generate a first spherical wave of right-handed circular polarized light having a negative focal length and a second spherical wave of left-handed circular polarized light having a positive focal length, a first polarizer configured to pass only a beam component therethrough in a predetermined polarization direction among components of the generated first and second spherical waves, a scanning unit configured to scan an object by using an interference beam generated between the first and second spherical waves passing through the first polarizer, and a first photodetector configured to detect a beam reflected from the object.Type: GrantFiled: July 3, 2023Date of Patent: July 30, 2024Assignee: CUBIXEL CO., LTD.Inventor: Tae Geun Kim
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Patent number: 11977353Abstract: An optical scanning holography system includes a polarization-sensitive lens configured to receive a linearly polarized beam and generate a first spherical wave of right-handed circular polarized light having a negative focal length and a second spherical wave of left-handed circular polarized light having a positive focal length, a first polarizer configured to pass only a beam component therethrough in a predetermined polarization direction among components of the generated first and second spherical waves, a scanning unit configured to scan an object by using an interference beam generated between the first and second spherical waves passing through the first polarizer, and a first photodetector configured to detect a beam reflected from the object.Type: GrantFiled: August 23, 2019Date of Patent: May 7, 2024Assignee: CUBIXEL CO., LTD.Inventor: Tae Geun Kim
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Publication number: 20230400673Abstract: The present invention relates to a flying-over beam pattern scanning hologram microscope device using a spatial modulation scanner and a translation stage. The present invention provides a flying-over beam pattern scanning hologram microscope device comprising: a scan beam generation unit which converts of a first beam and a second beam to a first spherical wave, and then makes the first and the second spherical waves interfere with each other to form a scan beam; a scanning unit, which comprises a spatial modulation scanner for controlling the scan beam in the horizontal direction, and a translation stage for moving an object in the vertical direction at the rear end of the projection unit; the projection unit projecting the scan beam onto an object plane; and a light collection unit which detects a beam that has passed through the objective lens again after being reflected or fluoresced from the object.Type: ApplicationFiled: March 7, 2022Publication date: December 14, 2023Applicant: CUBIXEL CO.,LTD.Inventors: Tae Geun KIM, Seung Ram LIM, Kyung Beom KIM, Eung Joon LEE, Dong Hwan IM
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Patent number: 11809134Abstract: Disclosed are a method and apparatus of automatic optical inspection using scanning holography. The apparatus for automatic optical inspection using scanning holography includes: a hologram capturer that takes a hologram of an object existing on an objective plate using a scanning hologram camera; a depth position/rotation angle extractor that extracts a depth position and a rotation angle about an objective surface of the objective plate on the basis of the hologram or the detected monitoring-light; a rotated coordinate system generator that generates a rotated coordinate system corresponding to the objective surface using the depth position and the rotation angle; and a hologram restorer that obtains an image of the object by restoring the hologram in a plane formed in a depth direction of the rotated coordinate system.Type: GrantFiled: June 3, 2020Date of Patent: November 7, 2023Assignee: CUBIXEL CO., LTD.Inventor: Tae Geun Kim
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Publication number: 20230350345Abstract: An optical scanning holography system includes a polarization-sensitive lens configured to receive a linearly polarized beam and generate a first spherical wave of right-handed circular polarized light having a negative focal length and a second spherical wave of left-handed circular polarized light having a positive focal length, a first polarizer configured to pass only a beam component therethrough in a predetermined polarization direction among components of the generated first and second spherical waves, a scanning unit configured to scan an object by using an interference beam generated between the first and second spherical waves passing through the first polarizer, and a first photodetector configured to detect a beam reflected from the object.Type: ApplicationFiled: July 3, 2023Publication date: November 2, 2023Applicant: CUBIXEL CO.,LTD.Inventor: Tae Geun KIM
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Publication number: 20230341814Abstract: An optical scanning holography system includes a polarization-sensitive lens configured to receive a linearly polarized beam and generate a first spherical wave of right-handed circular polarized light having a negative focal length and a second spherical wave of left-handed circular polarized light having a positive focal length, a first polarizer configured to pass only a beam component therethrough in a predetermined polarization direction among components of the generated first and second spherical waves, a scanning unit configured to scan an object by using an interference beam generated between the first and second spherical waves passing through the first polarizer, and a first photodetector configured to detect a beam reflected from the object.Type: ApplicationFiled: July 3, 2023Publication date: October 26, 2023Applicant: CUBIXEL CO.,LTD.Inventor: Tae Geun KIM
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FLYING-OVER BEAM PATTERN SCANNING HOLOGRAM MICROSCOPE DEVICE USING SCAN MIRROR AND TRANSLATION STAGE
Publication number: 20230324667Abstract: A flying-over beam pattern scanning hologram microscope device includes: a scan beam generation unit which converts a first beam and a second beam to a first spherical wave and a second spherical wave, and then allows the first and second spherical waves to interfere with each other to form a scan beam; a scanning unit, which comprises a scan mirror for controlling the scan beam in the horizontal direction, and a translation stage for moving an object in the vertical direction at the rear end of the projection unit; the projection unit projecting the scan beam onto an object plane; and a light collection unit for detecting a beam that has passed through the objective lens again after fluorescing or being reflected from an object.Type: ApplicationFiled: September 6, 2021Publication date: October 12, 2023Applicant: CUBIXEL CO.,LTD.Inventors: Tae Geun KIM, Tae Woong KIM, Seung Ram LIM, Kyung Beom KIM, Eung Joon LEE, Dong Hwan IM -
Publication number: 20230297027Abstract: A geometric phase in-line scanning holography system for a transmissive object, includes: a polarization sensitive lens, which receives a linear polarization beam to generate a first spherical wave of right-sided circularly polarized light and a second spherical wave of left-sided circularly polarized light; a scan means for scanning the transmissive object by using an interference beam generated between the generated first and second spherical waves; a first beam splitter, which receives a beam having been transmitted through the transmissive object, so as to split the received beam into first and second output beams; first and second polarizers for polarizing the first and second output beams, respectively; and first and second photodetectors for detecting output beams having passed through the first and second polarizers.Type: ApplicationFiled: July 15, 2021Publication date: September 21, 2023Applicant: CUBIXEL CO.,LTD.Inventor: Tae Geun KIM
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Publication number: 20220317625Abstract: The present invention relates to an inline scanning holography system for a phosphor and a transmitter. According to the present invention, the inline scanning holography system includes a polarization sensitive lens that receives a linearly polarized beam and generates a first spherical wave of right-handed circular polarized light having a negative focal length and a second spherical wave of left-handed circular polarized light having a positive focal length, a polarizer that passes only a beam component in a predetermined polarization direction therethrough among components of the generated first and second spherical waves, a scanning unit for scanning a phosphor by using an interference beam generated between the first and second spherical waves passing through the polarizer, and a first photodetector that detects a fluorescent beam diverged from the phosphor.Type: ApplicationFiled: September 11, 2020Publication date: October 6, 2022Applicant: CUBIXEL CO., LTD.Inventor: Tae Geun KIM