Patents Assigned to CYRUSTEK CORPORATION
  • Patent number: 9176187
    Abstract: A Data acquisition apparatus for measuring purpose can be used as a Digital Multi-Meter (DMM) as well as a LCR meter, and this apparatus can be implemented in semiconductor chip adopted in a handheld case, it includes a DMM and a LCR meter. The LCR meter includes a LCR measuring circuit implemented with integrated circuit. The LCR measuring circuit includes an impedance measuring circuit and an auto-zero amplifier which bias the input offset voltage and amplify the input signal that has passed a big resistor (PTC) to make the signal have a predetermined SNR suitable for the process by the LCR measuring circuit.
    Type: Grant
    Filed: January 24, 2014
    Date of Patent: November 3, 2015
    Assignee: CYRUSTEK CORPORATION
    Inventor: Yen-Hung Yeh
  • Publication number: 20150028892
    Abstract: A Data acquisition apparatus for measuring purpose can be used as a Digital Multi-Meter (DMM) as well as a LCR meter, and this apparatus can be implemented in semiconductor chip adopted in a handheld case, it includes a DMM and a LCR meter. The LCR meter includes a LCR measuring circuit implemented with integrated circuit. The LCR measuring circuit includes an impedance measuring circuit and an auto-zero amplifier which bias the input offset voltage and amplify the input signal that has passed a big resistor (PTC) to make the signal have a predetermined SNR suitable for the process by the LCR measuring circuit.
    Type: Application
    Filed: January 24, 2014
    Publication date: January 29, 2015
    Applicant: CYRUSTEK CORPORATION
    Inventor: Yen-Hung YEH