Patents Assigned to Czech Technical University in Prague
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Patent number: 8297103Abstract: The invention concerns a method of and apparatus for measurement and/or calibration of the position of an object in space in such embodiment where the apparatus contains at least one moving arm fitted to the frame on one end and on the other end fitted to a platform, where the platform can be attached to the object to be measured or calibrated; during the motion of the object with the platform attached the relative positions of individual members of at least one moving arm, frame and platform are read and the measured data is used for determination of the position of the object or for its calibration.Type: GrantFiled: December 20, 2006Date of Patent: October 30, 2012Assignees: Czech Technical University In Prague, INOMECH S.R.O.Inventors: Michael Valasek, Frantisek Petru, Zbynek Sika, Václav Bauma, Roman Smid
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Patent number: 8295604Abstract: An image search method that is robust and fast (with computational complexity of logarithmic order relative to the number of models). The image search method including: extracting a plurality of specific regions possessing such a property that a shape can be normalized regardless of an affine transformation thereof, as affine-invariant regions from one or more learning images; calculating, with respect to a reference affine-invariant region, other neighboring affine-invariant regions as a set; deforming the neighboring affine-invariant regions by a transformation to normalize the shape of the reference affine-invariant region; and outputting the deformed shapes of the neighboring affine-invariant regions, together with combination of the reference affine-invariant region and the neighboring affine-invariant regions.Type: GrantFiled: August 31, 2006Date of Patent: October 23, 2012Assignees: Toyota Jidosha Kabushiki Kaisha, Czech Technical University in PragueInventors: Katsuhiro Sakai, Ondrej Chum, Jiri Matas
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Method, apparatus and computer program for measuring the dose, dose rate or composition of radiation
Patent number: 8168953Abstract: A method and an apparatus for measuring the dose, the dose rate and/or the composition of radiation is disclosed. In the method, a detector means is exposed to a radiation environment, the detector means comprising an array of radiation sensing detector elements. The detector means is switched in a sensitive state for the duration of a sensitive time period, and during said sensitive time period, an interaction pattern generated by individual radiation quanta interacting with one or more of the detector elements is recorded. The duration of the sensitive time period can be precisely adapted to the intensity of the radiation that has to be recorded. The interaction pattern is analyzed to distinguish individual radiation quanta received during the sensitive time period, and a radiation category is assigned to each of the distinguished radiation quanta based on its corresponding interaction pattern.Type: GrantFiled: May 23, 2011Date of Patent: May 1, 2012Assignees: CERN-European Organization for Nuclear Research, Czech Technical University of PragueInventors: Erik Henricus M. Heijne, Stanislav Pospisil -
METHOD, APPARATUS AND COMPUTER PROGRAM FOR MEASURING THE DOSE, DOSE RATE OR COMPOSITION OF RADIATION
Publication number: 20110297836Abstract: A method and an apparatus for measuring the dose, the dose rate and/or the composition of radiation is disclosed. In the method, a detector means is exposed to a radiation environment, the detector means comprising an array of radiation sensing detector elements. The detector means is switched in a sensitive state for the duration of a sensitive time period, and during said sensitive time period, an interaction pattern generated by individual radiation quanta interacting with one or more of the detector elements is recorded. The duration of the sensitive time period can be precisely adapted to the intensity of the radiation that has to be recorded. The interaction pattern is analyzed to distinguish individual radiation quanta received during the sensitive time period, and a radiation category is assigned to each of the distinguished radiation quanta based on its corresponding interaction pattern.Type: ApplicationFiled: September 30, 2008Publication date: December 8, 2011Applicants: Czech Technical University of Prague, CERN-European Organization for Nuclear ResearchInventors: Erik Henricus M. HEIJNE, Stanislav Pospisil -
Patent number: 7994685Abstract: The function of the key element of the SMA, is based on a mutual alternating slipping of two systems of filaments. Its contraction is caused by the attractive effect of van der Waal's forces between the functional particles among the filaments. The relaxation is attained through the repulsive effect of the electrostatic repulsive forces between the functional particles. The alternating change of ionic concentration in the area of the particles results in the alternating function of van der Waal's attraction and repulsive electrostatic forces. The size and material of the particles, their configuration and working temperature must be specifically optimized. The total contraction of the key element results from the summation of its partial contractions. The total force and contraction of the SNA result from the summation of the key elements in the parallel (collateral) and/or serial (linear ranked) arrangements, respectively.Type: GrantFiled: December 21, 2006Date of Patent: August 9, 2011Assignee: Czech Technical University in PragueInventor: Václav Bouda
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Publication number: 20110101695Abstract: A fluid turbine includes stator fitted with fluid inlet and outlet, and a rolling rotor installed inside the confusor part of the stator at one end of a shaft, with the other end fixed in a clamp of a clamping mechanism on the stator. The shaft of the rolling rotor is fixed in the clamp of the clamping mechanism non-rotationally with the possibility of angular deflection in all directions. A generator is connected to the shaft.Type: ApplicationFiled: April 10, 2008Publication date: May 5, 2011Applicant: Czech Technical University in Prague, Faculty of Civil EngineeringInventors: Miroslav Sedlácek, Václav Beran, Jiri Novák
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Publication number: 20090179520Abstract: The function of the key element of the SMA, is based on a mutual alternating slipping of two systems of filaments. Its contraction is caused by the attractive effect of van der Waal's forces between the functional particles among the filaments. The relaxation is attained through the repulsive effect of the electrostatic repulsive forces between the functional particles. The alternating change of ionic concentration in the area of the particles results in the alternating function of van der Waal's attraction and repulsive electrostatic forces. The size and material of the particles, their configuration and working temperature must be specifically optimized. The total contraction of the key element results from the summation of its partial contractions. The total force and contraction of the SNA result from the summation of the key elements in the parallel (collateral) and/or serial (linear ranked) arrangements, respectively.Type: ApplicationFiled: December 21, 2006Publication date: July 16, 2009Applicant: Czech Technical University in PragueInventor: Václav Bouda
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METHOD, APPARATUS AND COMPUTER PROGRAM FOR MEASURING THE DOSE, DOSE RATE OR COMPOSITION OF RADIATION
Publication number: 20090057562Abstract: A method and an apparatus for measuring the dose, the dose rate and/or the composition of radiation is disclosed. In the method, a detector means is exposed to a radiation environment, the detector means comprising an array of radiation sensing detector elements. The detector means is switched in a sensitive state for the duration of a sensitive time period, and during said sensitive time period, an interaction pattern generated by individual radiation quanta interacting with one or more of the detector elements is recorded. The duration of the sensitive time period can be precisely adapted to the intensity of the radiation that has to be recorded. The interaction pattern is analyzed to distinguish individual radiation quanta received during the sensitive time period, and a radiation category is assigned to each of the distinguished radiation quanta based on its corresponding interaction pattern.Type: ApplicationFiled: September 30, 2008Publication date: March 5, 2009Applicants: CERN-European Organization for Nuclear Research, Czech Technical University of PragueInventors: Erik Henricus M. HEIJNE, Stanislav Pospisil