Patents Assigned to Czech Technical University in Prague
  • Patent number: 8297103
    Abstract: The invention concerns a method of and apparatus for measurement and/or calibration of the position of an object in space in such embodiment where the apparatus contains at least one moving arm fitted to the frame on one end and on the other end fitted to a platform, where the platform can be attached to the object to be measured or calibrated; during the motion of the object with the platform attached the relative positions of individual members of at least one moving arm, frame and platform are read and the measured data is used for determination of the position of the object or for its calibration.
    Type: Grant
    Filed: December 20, 2006
    Date of Patent: October 30, 2012
    Assignees: Czech Technical University In Prague, INOMECH S.R.O.
    Inventors: Michael Valasek, Frantisek Petru, Zbynek Sika, Václav Bauma, Roman Smid
  • Patent number: 8295604
    Abstract: An image search method that is robust and fast (with computational complexity of logarithmic order relative to the number of models). The image search method including: extracting a plurality of specific regions possessing such a property that a shape can be normalized regardless of an affine transformation thereof, as affine-invariant regions from one or more learning images; calculating, with respect to a reference affine-invariant region, other neighboring affine-invariant regions as a set; deforming the neighboring affine-invariant regions by a transformation to normalize the shape of the reference affine-invariant region; and outputting the deformed shapes of the neighboring affine-invariant regions, together with combination of the reference affine-invariant region and the neighboring affine-invariant regions.
    Type: Grant
    Filed: August 31, 2006
    Date of Patent: October 23, 2012
    Assignees: Toyota Jidosha Kabushiki Kaisha, Czech Technical University in Prague
    Inventors: Katsuhiro Sakai, Ondrej Chum, Jiri Matas
  • Patent number: 8168953
    Abstract: A method and an apparatus for measuring the dose, the dose rate and/or the composition of radiation is disclosed. In the method, a detector means is exposed to a radiation environment, the detector means comprising an array of radiation sensing detector elements. The detector means is switched in a sensitive state for the duration of a sensitive time period, and during said sensitive time period, an interaction pattern generated by individual radiation quanta interacting with one or more of the detector elements is recorded. The duration of the sensitive time period can be precisely adapted to the intensity of the radiation that has to be recorded. The interaction pattern is analyzed to distinguish individual radiation quanta received during the sensitive time period, and a radiation category is assigned to each of the distinguished radiation quanta based on its corresponding interaction pattern.
    Type: Grant
    Filed: May 23, 2011
    Date of Patent: May 1, 2012
    Assignees: CERN-European Organization for Nuclear Research, Czech Technical University of Prague
    Inventors: Erik Henricus M. Heijne, Stanislav Pospisil
  • Publication number: 20110297836
    Abstract: A method and an apparatus for measuring the dose, the dose rate and/or the composition of radiation is disclosed. In the method, a detector means is exposed to a radiation environment, the detector means comprising an array of radiation sensing detector elements. The detector means is switched in a sensitive state for the duration of a sensitive time period, and during said sensitive time period, an interaction pattern generated by individual radiation quanta interacting with one or more of the detector elements is recorded. The duration of the sensitive time period can be precisely adapted to the intensity of the radiation that has to be recorded. The interaction pattern is analyzed to distinguish individual radiation quanta received during the sensitive time period, and a radiation category is assigned to each of the distinguished radiation quanta based on its corresponding interaction pattern.
    Type: Application
    Filed: September 30, 2008
    Publication date: December 8, 2011
    Applicants: Czech Technical University of Prague, CERN-European Organization for Nuclear Research
    Inventors: Erik Henricus M. HEIJNE, Stanislav Pospisil
  • Patent number: 7994685
    Abstract: The function of the key element of the SMA, is based on a mutual alternating slipping of two systems of filaments. Its contraction is caused by the attractive effect of van der Waal's forces between the functional particles among the filaments. The relaxation is attained through the repulsive effect of the electrostatic repulsive forces between the functional particles. The alternating change of ionic concentration in the area of the particles results in the alternating function of van der Waal's attraction and repulsive electrostatic forces. The size and material of the particles, their configuration and working temperature must be specifically optimized. The total contraction of the key element results from the summation of its partial contractions. The total force and contraction of the SNA result from the summation of the key elements in the parallel (collateral) and/or serial (linear ranked) arrangements, respectively.
    Type: Grant
    Filed: December 21, 2006
    Date of Patent: August 9, 2011
    Assignee: Czech Technical University in Prague
    Inventor: Václav Bouda
  • Publication number: 20110101695
    Abstract: A fluid turbine includes stator fitted with fluid inlet and outlet, and a rolling rotor installed inside the confusor part of the stator at one end of a shaft, with the other end fixed in a clamp of a clamping mechanism on the stator. The shaft of the rolling rotor is fixed in the clamp of the clamping mechanism non-rotationally with the possibility of angular deflection in all directions. A generator is connected to the shaft.
    Type: Application
    Filed: April 10, 2008
    Publication date: May 5, 2011
    Applicant: Czech Technical University in Prague, Faculty of Civil Engineering
    Inventors: Miroslav Sedlácek, Václav Beran, Jiri Novák
  • Publication number: 20090179520
    Abstract: The function of the key element of the SMA, is based on a mutual alternating slipping of two systems of filaments. Its contraction is caused by the attractive effect of van der Waal's forces between the functional particles among the filaments. The relaxation is attained through the repulsive effect of the electrostatic repulsive forces between the functional particles. The alternating change of ionic concentration in the area of the particles results in the alternating function of van der Waal's attraction and repulsive electrostatic forces. The size and material of the particles, their configuration and working temperature must be specifically optimized. The total contraction of the key element results from the summation of its partial contractions. The total force and contraction of the SNA result from the summation of the key elements in the parallel (collateral) and/or serial (linear ranked) arrangements, respectively.
    Type: Application
    Filed: December 21, 2006
    Publication date: July 16, 2009
    Applicant: Czech Technical University in Prague
    Inventor: Václav Bouda
  • Publication number: 20090057562
    Abstract: A method and an apparatus for measuring the dose, the dose rate and/or the composition of radiation is disclosed. In the method, a detector means is exposed to a radiation environment, the detector means comprising an array of radiation sensing detector elements. The detector means is switched in a sensitive state for the duration of a sensitive time period, and during said sensitive time period, an interaction pattern generated by individual radiation quanta interacting with one or more of the detector elements is recorded. The duration of the sensitive time period can be precisely adapted to the intensity of the radiation that has to be recorded. The interaction pattern is analyzed to distinguish individual radiation quanta received during the sensitive time period, and a radiation category is assigned to each of the distinguished radiation quanta based on its corresponding interaction pattern.
    Type: Application
    Filed: September 30, 2008
    Publication date: March 5, 2009
    Applicants: CERN-European Organization for Nuclear Research, Czech Technical University of Prague
    Inventors: Erik Henricus M. HEIJNE, Stanislav Pospisil