Abstract: A method and apparatus which provide for measurement of embedded EMH, HIRF, or EMI (collectively referred to herein as EMH components), non-destructive measurement of embedded EMH components, component determination using only a simple current measurement; component determination without a priori knowledge of the range of values, the architecture of the test circuit that uses three MOSFET (or equivalent), switches, current measuring circuits, and suitable timing to accurately determine the component values, measurement of an embedded capacitor with relatively unknown parallel load resistance, and/or non-destructive measurement of R/C/TPD type components for any application.