Abstract: A calibration device for a non-destructive inspection/measurement system is provided, including an excitation coil; a detection coil; and a computer that applies a sinusoidal signal or a combined signal including multiple sinusoids having mutually different frequencies to the excitation coil in order to excite a pipe body, and that detects changes in the output voltage of the detection coil. The calibration device calibrates the detection results in the computer by entering, as variables in simultaneous equations, the amplitudes and phase differences of the output voltage of the detection coil at multiple calibration points of known thickness on the pipe body. The calibration device performs calibrations by using multiple different calibration conditions at each of the calibration points, and entering, into the simultaneous equations, the amplitudes and phase differences of the output voltage of the detection coil for each of the calibration conditions.
Type:
Grant
Filed:
October 4, 2017
Date of Patent:
March 3, 2020
Assignee:
DAINICHI Machine and Engineering Co., Ltd.
Abstract: A calibration device for a non-destructive inspection/measurement system is provided, including an excitation coil; a detection coil; and a computer that applies a sinusoidal signal or a combined signal including multiple sinusoids having mutually different frequencies to the excitation coil in order to excite a pipe body, and that detects changes in the output voltage of the detection coil. The calibration device calibrates the detection results in the computer by entering, as variables in simultaneous equations, the amplitudes and phase differences of the output voltage of the detection coil at multiple calibration points of known thickness on the pipe body. The calibration device performs calibrations by using multiple different calibration conditions at each of the calibration points, and entering, into the simultaneous equations, the amplitudes and phase differences of the output voltage of the detection coil for each of the calibration conditions.
Type:
Application
Filed:
October 4, 2017
Publication date:
April 5, 2018
Applicant:
DAINICHI Machine and Engineering Co., Ltd.
Abstract: In conventional non-destructive inspection devices using magnetism, the subject of inspection was limited to the surface layer of the test object as a result of the skin effect, and it was not possible to perform flaw detection inspection at the interior or reverse surface of thick-structured test objects. The effect of the surface effect was eliminated by imparting an external signal canceling the detection output of the test object surface layer from the detection output of a magnetic field resulting from eddy currents induced in the test object. As a result, it has become possible to extract the detection output of the test object interior that had been masked by the detection output of the test object surface layer, and it has become possible to perform thickness inspection and flaw detection of the reverse surface and interior or a test object.
Type:
Grant
Filed:
August 13, 2013
Date of Patent:
September 27, 2016
Assignee:
DAINICHI Machine and Engineering Co., Ltd.
Abstract: [Problem] In conventional non-destructive inspection devices using magnetism, the subject of inspection was limited to the surface layer of the test object as a result of the skin effect, and it was not possible to perform flaw detection inspection at the interior or reverse surface of thick-structured test objects. [Solution] The effect of the surface effect was eliminated by imparting an external signal canceling the detection output of the test object surface layer from the detection output of a magnetic field resulting from eddy currents induced in the test object. As a result, it has become possible to extract the detection output of the test object interior that had been masked by the detection output of the test object surface layer, and it has become possible to perform thickness inspection and flaw detection of the reverse surface and interior or a test object.
Type:
Application
Filed:
August 13, 2013
Publication date:
February 27, 2014
Applicant:
DAINICHI Machine and Engineering Co., Ltd.