Patents Assigned to DAINICHI Machine and Engineering Co., Ltd.
  • Patent number: 10578584
    Abstract: A calibration device for a non-destructive inspection/measurement system is provided, including an excitation coil; a detection coil; and a computer that applies a sinusoidal signal or a combined signal including multiple sinusoids having mutually different frequencies to the excitation coil in order to excite a pipe body, and that detects changes in the output voltage of the detection coil. The calibration device calibrates the detection results in the computer by entering, as variables in simultaneous equations, the amplitudes and phase differences of the output voltage of the detection coil at multiple calibration points of known thickness on the pipe body. The calibration device performs calibrations by using multiple different calibration conditions at each of the calibration points, and entering, into the simultaneous equations, the amplitudes and phase differences of the output voltage of the detection coil for each of the calibration conditions.
    Type: Grant
    Filed: October 4, 2017
    Date of Patent: March 3, 2020
    Assignee: DAINICHI Machine and Engineering Co., Ltd.
    Inventors: Kazuma Takakura, Gijun Idei, Masao Kaizuka
  • Publication number: 20180095056
    Abstract: A calibration device for a non-destructive inspection/measurement system is provided, including an excitation coil; a detection coil; and a computer that applies a sinusoidal signal or a combined signal including multiple sinusoids having mutually different frequencies to the excitation coil in order to excite a pipe body, and that detects changes in the output voltage of the detection coil. The calibration device calibrates the detection results in the computer by entering, as variables in simultaneous equations, the amplitudes and phase differences of the output voltage of the detection coil at multiple calibration points of known thickness on the pipe body. The calibration device performs calibrations by using multiple different calibration conditions at each of the calibration points, and entering, into the simultaneous equations, the amplitudes and phase differences of the output voltage of the detection coil for each of the calibration conditions.
    Type: Application
    Filed: October 4, 2017
    Publication date: April 5, 2018
    Applicant: DAINICHI Machine and Engineering Co., Ltd.
    Inventors: Kazuma TAKAKURA, Gijun IDEI, Masao KAIZUKA
  • Patent number: 9453817
    Abstract: In conventional non-destructive inspection devices using magnetism, the subject of inspection was limited to the surface layer of the test object as a result of the skin effect, and it was not possible to perform flaw detection inspection at the interior or reverse surface of thick-structured test objects. The effect of the surface effect was eliminated by imparting an external signal canceling the detection output of the test object surface layer from the detection output of a magnetic field resulting from eddy currents induced in the test object. As a result, it has become possible to extract the detection output of the test object interior that had been masked by the detection output of the test object surface layer, and it has become possible to perform thickness inspection and flaw detection of the reverse surface and interior or a test object.
    Type: Grant
    Filed: August 13, 2013
    Date of Patent: September 27, 2016
    Assignee: DAINICHI Machine and Engineering Co., Ltd.
    Inventors: Kunihiko Nakamura, Gijun Idei
  • Publication number: 20140055130
    Abstract: [Problem] In conventional non-destructive inspection devices using magnetism, the subject of inspection was limited to the surface layer of the test object as a result of the skin effect, and it was not possible to perform flaw detection inspection at the interior or reverse surface of thick-structured test objects. [Solution] The effect of the surface effect was eliminated by imparting an external signal canceling the detection output of the test object surface layer from the detection output of a magnetic field resulting from eddy currents induced in the test object. As a result, it has become possible to extract the detection output of the test object interior that had been masked by the detection output of the test object surface layer, and it has become possible to perform thickness inspection and flaw detection of the reverse surface and interior or a test object.
    Type: Application
    Filed: August 13, 2013
    Publication date: February 27, 2014
    Applicant: DAINICHI Machine and Engineering Co., Ltd.
    Inventors: Kunihiko NAKAMURA, Gijun IDEI