Patents Assigned to Dalian Senbior Surveying Instrument Technology Co,. Ltd.
  • Patent number: 11402054
    Abstract: Provided is a surveying stand capable of precisely adjusting the angle of a staff. The surveying stand comprises an annular first pedestal (1) and support legs (2) connected to the first pedestal (1). A staff fixture (3) is disposed in the first pedestal (1). A staff alignment device is connected to the first pedestal (1). The staff fixture (3) can rotate horizontally relative to the first pedestal (1). A rotation adjustment device capable of adjusting the rotation angle of the staff fixture (3) is arranged between the first pedestal (1) and the staff fixture (3). The surveying stand is easy to operate and is capable of precisely adjusting the angle of the staff.
    Type: Grant
    Filed: March 21, 2017
    Date of Patent: August 2, 2022
    Assignee: DALIAN SENBIOR SURVEYING INSTRUMENT TECHNOLOGY CO., LTD.
    Inventors: Yanchun Liu, Qiang Meng
  • Patent number: 11029151
    Abstract: A traverse-type measurement method for a dual-system bilateral-survey composite level (A, B) is an intelligent traverse-type measurement method for integrated three-level error control loop inspection with the dual-system bilateral survey compound level (A, B). Specifically, survey station single-instrument inspection, survey station dual-instrument cross-inspection, and multi-survey station dual-instrument cumulative cross-inspection are adopted, and the number of observations and distance between survey stations are adjusted, such that measurement error is dynamically controlled in real time, ensuring that height difference measurement of survey stations and of measurement sections meets a preset precision requirement regardless of location or time, avoiding the invalid measurements that frequently occur with traditional levels, and improving working efficiency and economic benefit of the composite level.
    Type: Grant
    Filed: April 19, 2018
    Date of Patent: June 8, 2021
    Assignee: DALIAN SENBIOR SURVEYING INSTRUMENT TECHNOLOGY CO., LTD.
    Inventors: Yanchun Liu, Qiang Meng, Yao Liu
  • Publication number: 20190204077
    Abstract: A traverse-type measurement method for a dual-system bilateral-survey composite level (A, B) is an intelligent traverse-type measurement method for integrated three-level error control loop inspection with the dual-system bilateral survey compound level (A, B). Specifically, survey station single-instrument inspection, survey station dual-instrument cross-inspection, and multi-survey station dual-instrument cumulative cross-inspection are adopted, and the number of observations and distance between survey stations are adjusted, such that measurement error is dynamically controlled in real time, ensuring that height difference measurement of survey stations and of measurement sections meets a preset precision requirement regardless of location or time, avoiding the invalid measurements that frequently occur with traditional levels, and improving working efficiency and economic benefit of the composite level.
    Type: Application
    Filed: April 19, 2018
    Publication date: July 4, 2019
    Applicant: Dalian Senbior Surveying Instrument Technology Co,. Ltd.
    Inventors: Yanchun LIU, Qiang MENG, Yao LIU