Patents Assigned to Dawatek, LLC
  • Patent number: 11977029
    Abstract: An Offset Raman imaging device and methods of use is disclosed and generally comprises a Raman laser and a XY plotter, wherein the Raman laser and the XY plotter are operably coupled to take Raman spectra scans of a region of interest.
    Type: Grant
    Filed: September 21, 2021
    Date of Patent: May 7, 2024
    Assignee: Dawatek, LLC
    Inventors: Isaac W. Chadri, Edward Guen-Murray