Abstract: A contactor assembly for testing electronic devices that are packaged with a dual-in-line pin array has an insulating base that mounts two rows of contacts, each adapted to flex into electrical connection with a pin of the device, and a pair of flexible ground planes each spaced closely from an associated one row of said contacts. A flexible, insulating spacer maintains the ground planes and their associated row of contacts with a substantially fixed spacing there between during the flexural movement of said contacts. In the preferred form, the upper edge of the ground planes adjacent the pins includes an arrangement for securing a chip electronic device, a capacitor or a resistor. The other end of the chip mounts a contact tip that makes electrical connection with an associated pin when the associated contact also connects with the pin. The signal path provided by the holder, chip and tip is extremely short, preferably less than 0.150 inch.

Abstract: A contactor assembly interconnects a surface mount integrated circuit device under test (DUT) with a test circuit. The assembly includes a main contact block with a central opening, a plug that mounts in the opening, and contact assemblies carried on the plug that each have contacts, a ground plane, and an insulating layer therebetween. Alignment pins locate the contact assemblies on the plug and other pins locate the plug within the contact block opening. The upper end of the contacts, cooperating with the plug, project freely toward a contact plane where they connect with associated pins of the DUT. The lower end of the plug simulates the DUT for insertion into a socket on the test circuit. Laterally adjustable conductive clips connect each ground plane to a ground member connected to the test circuit and located around the socket.

Abstract: In an automated high speed test handler for integrated circuits (IC's) an articulated vacuum picker reciprocates to transfer IC's successively from a staging area to a test site. Movable stops position and locate the IC at a test site. A sliding plate mounts the picker and carries cam surfaces to control the stops. A reciprocating placer mechanism carrying a multi-port vacuum manifold carries an IC being tested from the test site to a test plane displaced laterally from the flow path of the device. The picker is balanced to rotate under the weight of the IC being carried against mutually inclined lateral guide rails so that the mechanism is self-centering. These guide and locating mechanisms accurately position the IC so that there is no need for a physical steering of the IC's as they approach the test plane or a separately actuated clamping of the device in the test plane.

Abstract: An accumulating and transfer unit for handling electronic devices such as integrated circuits (ICs), especially surface mounted devices (SMDs). The unit includes guideways mounted circumferentially around a central shaft between two end plates and is inclined from the horizontal to utilize gravity, in cooperation with the levitation provided by a continuous or pulsed stream of air, to move the parts longitudinally in a column from the raised end of the unit to the lower end. In one embodiment, the guideways consist of a generally U-shaped track mounted on a track support and secured with a locking plate. A pair of longitudinally extending spaced apart walls on the bottom of each track act in cooperation with the track support and the locking plate to form a channel that directs the pulsed air from a supply tube at one end of the channel to a series of spaced apart apertures formed in the bottom wall of the track disposed so that the air acts through the apertures on the ICs held in the track.

Abstract: An apparatus for metering and singulating electronic devices such as integrated circuits that are arrayed initially in a column. A support member positioned over one end of the column has a plurality of spaced apart coil springs that extend radially to engage a leading one of the devices. The support member rotates at a constant rate to carry one or more of the springs into engagement with the leading device, upon further rotation deflect the spring to store energy, and upon still further rotation, cause the spring or springs to snap back to their initial radial orientation thereby accelerating the leading device to separate it from the column.

Abstract: A contactor assembly for rapidly and repeatedly electronically testing surface-mounted integrated circuits (IC's), in conjunction with a test handler. The contactor assembly has rows of flexible, slightly bent, cantilevered contacts which are deformed into a plane parallel to the device when undergoing the electronic test. A conductive plate or plates including a capacitor or capacitors is positioned parallel to and closely spaced from the device under test ("DUT"). The capacitor is a decoupler and acts to minimize ground noise during current surges. Ground cables interleaved with signal cables, and in some embodiments the signal lines interacting with other elements of the assembly, cooperate to produce generally "characteristic" (purely resistive) impedance to a fast rising test signal. The assembly may include a plug which fits into a socket designed for the DUT.

Abstract: A contactor assembly for testing electronic devices that are packaged with a dual-in-line pin array has an insulating base that mounts two rows of contacts, each adapted to flex into electrical connection with a pin of the device, and a pair of flexible ground planes each spaced closely from an associated one row of said contacts. A flexible, insulating spacer maintains the ground planes and their associated row of contacts with a substantially fixed spacing there between during the flexural movement of said contacts. In the preferred form, the upper edge of the ground planes adjacent the pins includes an arrangement for securing a chip electornic device, a capacitor or a resistor. The other end of the chip mounts a contact tip that makes electrical connection with an associated pin when the associated contact also connects with the pin. The signal path provided by the holder, chip and tip is extremely short, preferably less than 0.150 inch.

Abstract: A device that brings a vertically falling integrated circuit to a rapid, bounce-free stop at a test site includes a set of relatively lightweight blades arrayed next to the fall path with their faces in a mutually spaced relationship. At its upper end, each blade is pivotally and loosely mounted on an energy absorbing elastomeric sleeve. At its lower end, each blade carries a stop member that projects into the fall path when the blade is in a first ("test") position. The stop members are generally aligned with one another horizontally across the fall path to define a stop surface that precisely locates an integrated circuit at the test site. The device includes an arrangement for repeatedly drawing the lower ends of the blades in unison to a second ("release") position where the stop members are clear of the fall path.

Abstract: An automatic system for feeding integrated circuits (IC's) stored in hollow tubes to the input of a test handler/sorter has an accumulating conveyor table that carries the tubes laterally to a pick-up position. The conveyor table is inclined from the horizontal and a stop surface at its lower edge supports and aligns a closed end of each tube. Sensor assemblies limit the lateral movement of the leading tube, assist in orienting the tube, and detect when it is located at the pick-up position and is properly oriented. The sensor assemblies generate a control signal that activates a gripping assembly organized about a plate that pivots on a rotating support frame. The gripping assembly includes centering cam inserts on one movable gripping member. One motor mounted on the frame rotates the gripping assembly and the gripped tube to the test handler/sorter input. The gripping assembly has a mechanism for controlling the discharge of IC's from the open end of the tube.

Abstract: Integrated circuits (IC's) are stored for a time interval in a set of elongated guideways to bring them to a preselected temperature prior to testing. The guideways each hold a line of IC's in a loose end-to-end array. A frame carries the guideways. The frame and guideways rotate about a central shaft that is generally aligned with the guideways. The guideways are rotatably mounted in the frame and a gear system, preferably one carried on the frame and the guideways, ensures that as the frame rotates the guideways maintain the same angular orientation with respect to the horizontal. In the preferred form the guideways are generally tubular members with an upwardly facing open channel and an opposed, spaced apart rail that retain and guide the IC's. The entire frame and the guideways carried in the frame are inclined from the horizontal to provide a gravity feed of the IC's from one of the guideways located at an "unloading" position.

Abstract: A drive system flexes the free ends of two parallel sets of contacts into electrical connection with two parallel rows of leads on an integrated circuit. The drive system uses a pair of opposed, identical actuator arms. A common, movable pivot axis, preferably one defined by a link pin pivotally connected to both arms, connects one end of the arms. A solenoid drive is connected to the link pin. Activation of the solenoid draws the link pin towards it which rotates each arm about a fixed pivot point to generate a symmetrical, pincer-like movement of the free ends of the arms. Push bars secured to these free ends drive the contacts into a flexed position. The symmetrical motion of the push bars minimizes lateral movement of the integrated circuit and develops a generally uniform contact force at all of the leads. A cable with an adjustable length preferably couples the drive element with the link pin.

Abstract: An inverting apparatus for reorienting electrically asymmetrical axial lead electronic devices in a testing and sorting machine has a wheel rotatably mounted in a magnetic output bin of the tester/sorter. The bin has sets of permanent magnets mounted in its side walls that create two oppositely directed magnetic fields that define upper and lower regions of the output bin. The axis of rotation of the wheel is generally aligned with the magnetic fields across the bin. The wheel carries a set of holder assemblies each mounted for free rotation on its outer circumference. Each holder assembly carries a bar magnet that aligns the holder assembly, and a device carried in the holder assembly, with the prevailing magnetic field. As the wheel rotates the holder assemblies and the devices they carry are transported from the magnetic field in the upper region to the oppositely directed field in the lower region. The bar magnet rotates the holder assembly and the device 180.degree.

Abstract: Disclosed is an interface assembly for use in conjunction with a test contactor assembly for integrated circuit (IC) electronic devices and the like. The test contactor assembly has at least one row of flexible contacts that are each secured at a lower end to a base. A conductive plate is also secured to the base and extends in a generally parallel, closely spaced relationship to each row of contacts. The dimensions of the plate and its spacing from the associated contacts produce a distributed capacitance with respect to each contact in the row such that a fast-rising test signal launched in a contact encounters a generally "characteristic" or purely resistive impedance that is frequency independent. The interface assembly, which connects the test contactor assembly to a test circuit, has a contactor board secured to the base of the contactor assembly. A pattern of conductive stripes is carried on at least one face of the board.

Abstract: A test contactor assembly for integrated circuit (IC) electronic devices and the like has at least one row of flexible contacts that are each secured at a lower end to a base. A conductive plate is also secured to the base and extends in a generlly parallel, closely spaced relationship to each row of contacts. The dimensions of the plate and its spacing from the associated contacts produce a distributed capacitance with respect to each contact in the row such that a fast-rising test signal launched in a contact encounters a generally "characteristic" or purely resistive impedance that is frequency independent. A flexible insulating material is preferably located between the plate and its associated row of contacts to maintain the desired spacing as the plate and the contacts are flexed into electrical connection with associated pins of the device.

Abstract: A magnetic storage system receives electronic axial lead devices, particularly polarized devices such as diodes, that are advancing axially from a sorter. The storage system includes a chute assembly with an upper run that funnels the devices to a stop wall spaced from the lower end of the run. The stopped device forms an acute angle with a magnetic field extending horizontally across the chute assembly to produce a controlled rotation of the device to a horizontal orientation. The reoriented device falls through the spacing to a lower chute run that guides it in a lateral mode of advance to a bin cassette replaceably secured between a pair of magnet pole pieces. The pole pieces have a tapered thickness to develop a downwardly increasing magnetic flux density that promotes a high packing density of the devices in the cassette. A flapper valve is manually operable to block movement of the devices on the second chute assembly while a loaded cassette is being replaced with an empty cassette.