Abstract: A receptacle for a semiconductor test socket has a body with a substantially planar surface and a plurality of female contact pins extending through the planar surface. Each of the female contact pins has an opening at one end through the planar surface. A protuberance extends from the body for insertion into a matching recess in the test socket for pre-aligning the male contact pins with the respective female contact pins on the receptacle.
Type:
Grant
Filed:
October 1, 1993
Date of Patent:
April 25, 1995
Assignee:
DB Design Group, Inc.
Inventors:
Derek Bowers, Rennie Bowers, Steven McGarvey