Abstract: A test fixture for use in systems designed to test circuit boards. The test fixture is adapted to receive pre-wired interchangeable modules which contain a plurality of fixed test probes disposed in an array mirroring the location of test points on the specific circuit board to be tested. The interchangeable modules have standardized arrays of intermediate connectors for mating with mirrored arrays of connectors on the frame of the test fixture.
Type:
Grant
Filed:
September 13, 1988
Date of Patent:
March 27, 1990
Assignee:
Design and Manufacturing Specialties, Inc.